Ultrasharp textures in Al/Ti layered structures

Research output: Article

2 Citations (Scopus)


The aim of the present work was to reveal the structure characteristics of Al/Ti layered structures. For this purpose, conventional (CTEM), high-resolution transmission electron microscopy (HRTEM) and standard X-ray diffractometer measurements have been applied. The layered Al films exhibit an ultrasharp 〈111〉 texture. The 〈111〉 pole density of the films increases linearly with increasing number of Al/Ti layer pairs. The Al layers contain grains oriented in the 〈111〉 crystalline direction only. The texture sharpness in the single Al films decreases with increasing thickness of the Ti underlayer.

Original languageEnglish
Pages (from-to)338-340
Number of pages3
JournalSurface and Coatings Technology
Issue number1-3
Publication statusPublished - márc. 1998


ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this