Thickness-dependent conductivity of near-stoichiometric V2O5 films deposited from gels

T. Szörényi, K. Bali, I. Török, I. Hevesi

Research output: Article

7 Citations (Scopus)

Abstract

The room temperature conductivity σ of initially nearly stoichiometric V2O5 films deposited from gels shows a marked thickness dependence. The analysis of conductivity data measured on films 50-3000 nm in thickness revealed that in air the films were spontaneously reduced from the air-film interface inwards forming layers of different chemical composition and conductivity. In the core layer, in which the initial composition presumably remains unchanged, σ ≈ 9 × 10-2 S m-1, while the conductivity of the reduced surface layer is considerably higher: σ ≈ 9 S m-1. In vacuum the conductivity of all the layers decreased by a factor of about 10 without much change in their relative order indicating that a varying water content uniformly affects the conductivities of all layers.

Original languageEnglish
Pages (from-to)29-34
Number of pages6
JournalThin Solid Films
Volume121
Issue number1
DOIs
Publication statusPublished - nov. 9 1984

Fingerprint

Gels
gels
conductivity
Air
Chemical analysis
Water content
air
Vacuum
moisture content
vanadium pentoxide
surface layers
chemical composition
vacuum
room temperature
Temperature

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Thickness-dependent conductivity of near-stoichiometric V2O5 films deposited from gels. / Szörényi, T.; Bali, K.; Török, I.; Hevesi, I.

In: Thin Solid Films, Vol. 121, No. 1, 09.11.1984, p. 29-34.

Research output: Article

Szörényi, T. ; Bali, K. ; Török, I. ; Hevesi, I. / Thickness-dependent conductivity of near-stoichiometric V2O5 films deposited from gels. In: Thin Solid Films. 1984 ; Vol. 121, No. 1. pp. 29-34.
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