Thermal stability of Mo-V epitaxial multilayers

A. Dudás, G. A. Langer, D. L. Beke, M. Kis-Varga, L. Daróczi, Z. Erdélyi

Research output: Article

10 Citations (Scopus)

Abstract

Epitaxial crystalline Mo-V multilayers are investigated based on structure degradation during annealing between 1000 and 1250 K using TEM and X-ray diffraction. The effect of interdiffusion coefficient strong concentration dependence on the diffusional homogenization is analyzed. Time evolution of the small and high angle diffraction Bragg peaks, considering the oxygen-uptake of V, is studied. It is shown that normal bulk diffusional homogenization can take place and the interdiffusion coefficient can be determined at good vacuum and above a given temperature.

Original languageEnglish
Pages (from-to)2008-2013
Number of pages6
JournalJournal of Applied Physics
Volume86
Issue number4
DOIs
Publication statusPublished - aug. 15 1999

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

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