Texture and secondary extinction measurements in Al/Ti stratified films by X-ray diffraction

I. Tomov, M. Adamik, P. Barna, V. Yamakov

Research output: Article

7 Citations (Scopus)

Abstract

In the present work the effects of secondary extinction has been studied using standard X-ray diffractometer and texture diffractometer techniques. For this purpose the texture of Al/Ti stratified films have been measured and evaluated. It is shown that these films have a very sharp single component texture. Therefore the evaluation and the interpretation of the measurement data is only possible when secondary extinction correction is carried out. The effect of secondary extinction is evaluated on the 111 pole figures of the stratified films with different layer pair numbers. The volume fraction of the main texture component is calculated from pole figures and it is shown that the grains of the films are practically completely oriented with 〈111〉 crystallographic direction parallel to the film surface normal. Moreover in the case of pole density measurements the secondary extinction values themselves are simultaneously calculated.

Original languageEnglish
Pages (from-to)497-502
Number of pages6
JournalVacuum
Volume50
Issue number3-4
Publication statusPublished - júl. 1 1998

Fingerprint

extinction
textures
Textures
X ray diffraction
Poles
diffraction
poles
Diffractometers
x rays
diffractometers
Light extinction
Volume fraction
X rays
evaluation

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Texture and secondary extinction measurements in Al/Ti stratified films by X-ray diffraction. / Tomov, I.; Adamik, M.; Barna, P.; Yamakov, V.

In: Vacuum, Vol. 50, No. 3-4, 01.07.1998, p. 497-502.

Research output: Article

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