Technique of polarized neutron reflectometry for direct measurement of depth of magnetic field penetration into Nb and YBa2Cu3O7 superconducting films

V. L. Aksenov, V. V. Lauter-Pasyuk, H. Lauter, P. Liderer, E. I. Kornilov, A. V. Petrenko

Research output: Article

Abstract

A direct measurement of the magnetic field penetration depth λL into Nb/Si and YBa1Cu3O7/SrTiO3 has been performed by polarized neutron reflectometry. Measurements were made at two scattering geometries: reflection from the `vacuum-film' side and from the `substrate-film' side. For the first time the spectral dependence of the spin asymmetry SA = (R+-R-)/(R++R-), where R+ and R- are the spin-dependent coefficients of the neutron reflection, was measured for a YBa2Cu3O7 film in a wide range of transferred momenta. The values of λL = (1400±100) angstroms at T = 4.8 K (H = 500 E) and λL = (1350±150) angstroms at T = 2 K (H = 300 E) were measured along the c-axis oriented perpendicular to the film surface for both scattering geometries.

Original languageEnglish
Pages (from-to)879-886
Number of pages8
JournalSurface Investigation X-Ray, Synchrotron and Neutron Techniques
Volume14
Issue number7
Publication statusPublished - jan. 1 1999

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

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