A direct measurement of the magnetic field penetration depth λL into Nb/Si and YBa1Cu3O7/SrTiO3 has been performed by polarized neutron reflectometry. Measurements were made at two scattering geometries: reflection from the `vacuum-film' side and from the `substrate-film' side. For the first time the spectral dependence of the spin asymmetry SA = (R+-R-)/(R++R-), where R+ and R- are the spin-dependent coefficients of the neutron reflection, was measured for a YBa2Cu3O7 film in a wide range of transferred momenta. The values of λL = (1400±100) angstroms at T = 4.8 K (H = 500 E) and λL = (1350±150) angstroms at T = 2 K (H = 300 E) were measured along the c-axis oriented perpendicular to the film surface for both scattering geometries.
|Number of pages||8|
|Journal||Surface Investigation X-Ray, Synchrotron and Neutron Techniques|
|Publication status||Published - jan. 1 1999|
ASJC Scopus subject areas
- Surfaces, Coatings and Films