Robust sine wave fitting in ADC testing

Attila Sárhegyi, I. Kollár

Research output: Conference contribution

9 Citations (Scopus)

Abstract

The IEEE standard 1241-2000 defines ADC testing methods which make use of least squares sine wave fitting algorithms. After sine fitting an error sequence is obtained and this is analyzed in order to determine the properties of the ADC. If the quantization noise dominates in this error sequence, the ADC error analysis may become somewhat misleading. This appears when the amplitude of the test signal is small enough or the amplitude is out of the range of the ADC. In this paper a new method is proposed and analysed to remedy the above phenomena. Furthermore, the new algorithm is compared with dithering.

Original languageEnglish
Title of host publicationConference Record - IEEE Instrumentation and Measurement Technology Conference
Pages914-919
Number of pages6
DOIs
Publication statusPublished - 2006
EventIMTC'06 - IEEE Instrumentation and Measurement Technology Conference - Sorrento, Italy
Duration: ápr. 24 2006ápr. 27 2006

Other

OtherIMTC'06 - IEEE Instrumentation and Measurement Technology Conference
CountryItaly
CitySorrento
Period4/24/064/27/06

Fingerprint

sine waves
error analysis
Testing
Error analysis

ASJC Scopus subject areas

  • Instrumentation

Cite this

Sárhegyi, A., & Kollár, I. (2006). Robust sine wave fitting in ADC testing. In Conference Record - IEEE Instrumentation and Measurement Technology Conference (pp. 914-919). [1700304] https://doi.org/10.1109/IMTC.2006.236674

Robust sine wave fitting in ADC testing. / Sárhegyi, Attila; Kollár, I.

Conference Record - IEEE Instrumentation and Measurement Technology Conference. 2006. p. 914-919 1700304.

Research output: Conference contribution

Sárhegyi, A & Kollár, I 2006, Robust sine wave fitting in ADC testing. in Conference Record - IEEE Instrumentation and Measurement Technology Conference., 1700304, pp. 914-919, IMTC'06 - IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 4/24/06. https://doi.org/10.1109/IMTC.2006.236674
Sárhegyi A, Kollár I. Robust sine wave fitting in ADC testing. In Conference Record - IEEE Instrumentation and Measurement Technology Conference. 2006. p. 914-919. 1700304 https://doi.org/10.1109/IMTC.2006.236674
Sárhegyi, Attila ; Kollár, I. / Robust sine wave fitting in ADC testing. Conference Record - IEEE Instrumentation and Measurement Technology Conference. 2006. pp. 914-919
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