Real-time atomic force microscopy imaging of photoinduced surface deformation in Asx Se100-x chalcogenide films

M. L. Trunov, P. M. Lytvyn, P. Nagy, O. M. Dyachyns'Ka

Research output: Article

37 Citations (Scopus)

Abstract

We present direct measurements of the kinetics of surface relief gratings (SRGs) formation in amorphous Asx Se100-x (20 xAs 50) thin films. SRGs are induced in different holographic schemes of recording using near-band-gap light and their growth is further facilitated by illumination with an interference pattern and observed in real time by in situ atomic force microscopy. It is found that the kinetics of SRG formation depends upon film composition and incident light polarization. The light-stimulated vectorial surface deformations are maximized for Se-rich glasses and increase even further by additional illumination during recording.

Original languageEnglish
Article number111908
JournalApplied Physics Letters
Volume96
Issue number11
DOIs
Publication statusPublished - 2010

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atomic force microscopy
gratings
recording
illumination
kinetics
interference
glass
polarization
thin films

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Real-time atomic force microscopy imaging of photoinduced surface deformation in Asx Se100-x chalcogenide films. / Trunov, M. L.; Lytvyn, P. M.; Nagy, P.; Dyachyns'Ka, O. M.

In: Applied Physics Letters, Vol. 96, No. 11, 111908, 2010.

Research output: Article

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