Probing of Ag-based resistive switching on the nanoscale

Research output: Conference contribution

2 Citations (Scopus)

Abstract

We study the switching characteristics of nanoscale junctions between a metallic tip and a silver film covered by a thin Ag 2S ionic conductor layer. Resistive switching phenomena are studied on samples of various Ag 2S layer thicknesses. Metallic and semiconductor behavior are distinguished by current-voltage characteristics measured at room temperature and at 4.2 K.

Original languageEnglish
Title of host publicationFrontier of Solid-State Ionics
Pages38-43
Number of pages6
DOIs
Publication statusPublished - dec. 1 2011
Event2011 MRS Spring Meeting - San Francisco, CA, United States
Duration: ápr. 25 2011ápr. 29 2011

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1331
ISSN (Print)0272-9172

Other

Other2011 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period4/25/114/29/11

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Geresdi, A., Halbritter, A., Szilágyi, E., & Mihály, G. (2011). Probing of Ag-based resistive switching on the nanoscale. In Frontier of Solid-State Ionics (pp. 38-43). (Materials Research Society Symposium Proceedings; Vol. 1331). https://doi.org/10.1557/opl.2011.1474