Optical beam deflection study of indium-hexacyanoferrate films

E. Csahók, E. Vieil, G. Inzelt

Research output: Conference article

5 Citations (Scopus)

Abstract

Optical beam deflection technique was employed to follow the ion transport and ion exchange processes taking place in the course of redox transformations of indium-hexacyanoferrate surface layers. The data analysis by the help of a convolution method attested that the principal charge compensating ions are cations and the contribution of anions to the charge neutralization inside the film is less than a few percents in the range [0, 0.85 V].

Original languageEnglish
Pages (from-to)2687-2688
Number of pages2
JournalSynthetic Metals
Volume103
Issue number1-3
DOIs
Publication statusPublished - jún. 24 1999
EventProceedings of the 1998 International Conference on Science and Technology of Synthetic Metals (ICSM-98) - Montpellier
Duration: júl. 12 1998júl. 18 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

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