Morphological changes of poly(tetrafluoroethylene)surface due to low current density proton irradiation

G. U.L. Nagy, R. Kerékgyártó, A. Csík, L. Daróczi, I. Rajta

Research output: Article

1 Citation (Scopus)

Abstract

The changes of the surface morphology of poly(tetrafluoroethylene)due to proton irradiation was investigated. 1 MeV proton beam was used for the irradiations with relatively low current densities, in the range of 10–100,000 pA/mm 2 . The applied ion fluences ranged from 0.1 to 2500 nC/mm 2 (6.24 * 10 10 –1.56 * 10 15 ion/cm 2 ). The surface was characterized by interference contrast microscopy, surface profilometry and scanning electron microscopy. The results show that at each current density the surface can be machined, and the etching depth is increasing with increasing ion fluence, up to a certain point. However, in each case there is a threshold value, between 50 and 100 nC/mm 2 , where the process turns back. First, the etching depth starts to decrease. Later, by further increasing the delivered ion fluence, an opposite process begins and the surface becomes protruding.

Original languageEnglish
Pages (from-to)71-74
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume449
DOIs
Publication statusPublished - jún. 15 2019

Fingerprint

Proton irradiation
proton irradiation
polytetrafluoroethylene
low currents
Polytetrafluoroethylenes
Current density
current density
Ions
fluence
Etching
ions
Profilometry
Proton beams
etching
Surface morphology
Microscopic examination
proton beams
Irradiation
Scanning electron microscopy
microscopy

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

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title = "Morphological changes of poly(tetrafluoroethylene)surface due to low current density proton irradiation",
abstract = "The changes of the surface morphology of poly(tetrafluoroethylene)due to proton irradiation was investigated. 1 MeV proton beam was used for the irradiations with relatively low current densities, in the range of 10–100,000 pA/mm 2 . The applied ion fluences ranged from 0.1 to 2500 nC/mm 2 (6.24 * 10 10 –1.56 * 10 15 ion/cm 2 ). The surface was characterized by interference contrast microscopy, surface profilometry and scanning electron microscopy. The results show that at each current density the surface can be machined, and the etching depth is increasing with increasing ion fluence, up to a certain point. However, in each case there is a threshold value, between 50 and 100 nC/mm 2 , where the process turns back. First, the etching depth starts to decrease. Later, by further increasing the delivered ion fluence, an opposite process begins and the surface becomes protruding.",
keywords = "Material modification, Poly(tetrafluoroethylene), Proton beam writing, PTFE, Scanning nuclear microprobe",
author = "Nagy, {G. U.L.} and R. Ker{\'e}kgy{\'a}rt{\'o} and A. Cs{\'i}k and L. Dar{\'o}czi and I. Rajta",
year = "2019",
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doi = "10.1016/j.nimb.2019.04.050",
language = "English",
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TY - JOUR

T1 - Morphological changes of poly(tetrafluoroethylene)surface due to low current density proton irradiation

AU - Nagy, G. U.L.

AU - Kerékgyártó, R.

AU - Csík, A.

AU - Daróczi, L.

AU - Rajta, I.

PY - 2019/6/15

Y1 - 2019/6/15

N2 - The changes of the surface morphology of poly(tetrafluoroethylene)due to proton irradiation was investigated. 1 MeV proton beam was used for the irradiations with relatively low current densities, in the range of 10–100,000 pA/mm 2 . The applied ion fluences ranged from 0.1 to 2500 nC/mm 2 (6.24 * 10 10 –1.56 * 10 15 ion/cm 2 ). The surface was characterized by interference contrast microscopy, surface profilometry and scanning electron microscopy. The results show that at each current density the surface can be machined, and the etching depth is increasing with increasing ion fluence, up to a certain point. However, in each case there is a threshold value, between 50 and 100 nC/mm 2 , where the process turns back. First, the etching depth starts to decrease. Later, by further increasing the delivered ion fluence, an opposite process begins and the surface becomes protruding.

AB - The changes of the surface morphology of poly(tetrafluoroethylene)due to proton irradiation was investigated. 1 MeV proton beam was used for the irradiations with relatively low current densities, in the range of 10–100,000 pA/mm 2 . The applied ion fluences ranged from 0.1 to 2500 nC/mm 2 (6.24 * 10 10 –1.56 * 10 15 ion/cm 2 ). The surface was characterized by interference contrast microscopy, surface profilometry and scanning electron microscopy. The results show that at each current density the surface can be machined, and the etching depth is increasing with increasing ion fluence, up to a certain point. However, in each case there is a threshold value, between 50 and 100 nC/mm 2 , where the process turns back. First, the etching depth starts to decrease. Later, by further increasing the delivered ion fluence, an opposite process begins and the surface becomes protruding.

KW - Material modification

KW - Poly(tetrafluoroethylene)

KW - Proton beam writing

KW - PTFE

KW - Scanning nuclear microprobe

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U2 - 10.1016/j.nimb.2019.04.050

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JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

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