Letter to the editor: Scanning tunnelling microscopy on insulating Ga2O3 thin-film ceramics

Wolfgang Hanrieder, Maximilian Fleischer, Hans Meixner

Research output: Article

13 Citations (Scopus)

Abstract

Scanning tunnelling microscopy images of stoichiometric and thus electrically insulating Ga2O3 thin films are presented for the first time. These ceramic films were deposited by RF sputtering. Characterisation was by means of RBS (stoichiometry) and X-ray fluorescence (contaminants). The scanning tunnelling microscopy results are consistent with those of high-resolution scanning electron microscopy. For scanning electron microscopy the specimens had to be covered by a thin metallisation. This was not necessary for the scanning tunnelling microscopy images. The presented results show that scanning tunnelling microscopy is suitable for the detailed study of insulating thin-film ceramics. This is a prerequisite for future studies of ultra-thin metallisation on thin film ceramics (supported catalysts) with superior vertical resolution.

Original languageEnglish
Pages (from-to)1938-1941
Number of pages4
JournalJournal of Physics D: Applied Physics
Volume22
Issue number12
DOIs
Publication statusPublished - dec. 14 1989

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

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