Kinetic shape formation during Gd thin film and Si(100) solid phase reaction

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Abstract

The solid phase reaction between a thin Gd film and a silicon wafer was examined by scanning electron microscopy and X ray diffraction analysis. Results show that the reaction produced a kinetic shape formation on the surface of the film.

Original languageEnglish
Pages (from-to)1672-1674
Number of pages3
JournalApplied Physics Letters
Volume74
Issue number12
DOIs
Publication statusPublished - márc. 22 1999

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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