In-situ mechanical characterization of wurtzite InAs nanowires

Rbert Erdlyi, Morten Hannibal Madsen, Gyrgy Sfrn, Zoltn Hajnal, Istvn Endre Lukcs, Gerg Flp, Szabolcs Csonka, Jesper Nygrd, Jnos Volk

Research output: Article

7 Citations (Scopus)


High aspect ratio vertical InAs nanowires were mechanically characterized in a scanning electron microscope equipped with two micromanipulators. One, equipped with a calibrated atomic force microscope probe, was used for in-situ static bending of single nanowires along the 〈1120〉 crystallographic direction. The other one was equipped with a tungsten tip for dynamic resonance excitation of the same nanowires. This setup enabled a direct comparison between the two techniques. The crystal structure was analyzed using transmission electron microscopy, and for InAs nanowires with a hexagonal wutzite crystal structure, the bending modulus value was found to BM=43.5 GPa. This value is significantly lower than previously reported for both cubic zinc blende InAs bulk crystals and InAs nanowires. Besides, due to their high resonance quality factor (Q>1200), the wurtzite InAs nanowires are shown to be a promising candidate for sub-femtogram mass detectors.

Original languageEnglish
Pages (from-to)1829-1833
Number of pages5
JournalSolid State Communications
Issue number19
Publication statusPublished - okt. 1 2012

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

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  • Cite this

    Erdlyi, R., Hannibal Madsen, M., Sfrn, G., Hajnal, Z., Endre Lukcs, I., Flp, G., Csonka, S., Nygrd, J., & Volk, J. (2012). In-situ mechanical characterization of wurtzite InAs nanowires. Solid State Communications, 152(19), 1829-1833.