Fractal and structural entropy calculations on the epitaxially grown fulleren structures with the help of image processing

Ákos Nemcsics, Szilvia Nagy, Imre Mojzes, Péter Turmezei

Research output: Conference contribution

1 Citation (Scopus)

Abstract

Molecular beam epitaxially grown fullerene layers are investigated with the help of image processing. The layered structures are studied in morphological respect. The individual layer morphologies are derived from the atomic force microscopy picture of the surface. The pattern morphology of the certain layers is analysed by box counting method. The surface morphology shows fractal behaviour. The pattern of each layer shows different dimension. The actual dimension depends on the actual distance of the layer from the substrate. The change of the dimension is attributed to the change of the binding behaviour. The topology of the surface is also studied using participation ratio and structural entropy calculations.

Original languageEnglish
Title of host publicationSISY 2009 - 7th International Symposium on Intelligent Systems and Informatics
Pages65-67
Number of pages3
DOIs
Publication statusPublished - 2009
EventSISY 2009 - 7th International Symposium on Intelligent Systems and Informatics - Subotica, Serbia
Duration: szept. 25 2009szept. 26 2009

Other

OtherSISY 2009 - 7th International Symposium on Intelligent Systems and Informatics
CountrySerbia
CitySubotica
Period9/25/099/26/09

Fingerprint

Fractals
Image processing
Entropy
Molecular beams
Fullerenes
Surface morphology
Atomic force microscopy
Topology
Substrates

ASJC Scopus subject areas

  • Artificial Intelligence
  • Information Systems

Cite this

Nemcsics, Á., Nagy, S., Mojzes, I., & Turmezei, P. (2009). Fractal and structural entropy calculations on the epitaxially grown fulleren structures with the help of image processing. In SISY 2009 - 7th International Symposium on Intelligent Systems and Informatics (pp. 65-67). [5291194] https://doi.org/10.1109/SISY.2009.5291194

Fractal and structural entropy calculations on the epitaxially grown fulleren structures with the help of image processing. / Nemcsics, Ákos; Nagy, Szilvia; Mojzes, Imre; Turmezei, Péter.

SISY 2009 - 7th International Symposium on Intelligent Systems and Informatics. 2009. p. 65-67 5291194.

Research output: Conference contribution

Nemcsics, Á, Nagy, S, Mojzes, I & Turmezei, P 2009, Fractal and structural entropy calculations on the epitaxially grown fulleren structures with the help of image processing. in SISY 2009 - 7th International Symposium on Intelligent Systems and Informatics., 5291194, pp. 65-67, SISY 2009 - 7th International Symposium on Intelligent Systems and Informatics, Subotica, Serbia, 9/25/09. https://doi.org/10.1109/SISY.2009.5291194
Nemcsics Á, Nagy S, Mojzes I, Turmezei P. Fractal and structural entropy calculations on the epitaxially grown fulleren structures with the help of image processing. In SISY 2009 - 7th International Symposium on Intelligent Systems and Informatics. 2009. p. 65-67. 5291194 https://doi.org/10.1109/SISY.2009.5291194
Nemcsics, Ákos ; Nagy, Szilvia ; Mojzes, Imre ; Turmezei, Péter. / Fractal and structural entropy calculations on the epitaxially grown fulleren structures with the help of image processing. SISY 2009 - 7th International Symposium on Intelligent Systems and Informatics. 2009. pp. 65-67
@inproceedings{118d44e6cf33404689b8b56bf66a9dc2,
title = "Fractal and structural entropy calculations on the epitaxially grown fulleren structures with the help of image processing",
abstract = "Molecular beam epitaxially grown fullerene layers are investigated with the help of image processing. The layered structures are studied in morphological respect. The individual layer morphologies are derived from the atomic force microscopy picture of the surface. The pattern morphology of the certain layers is analysed by box counting method. The surface morphology shows fractal behaviour. The pattern of each layer shows different dimension. The actual dimension depends on the actual distance of the layer from the substrate. The change of the dimension is attributed to the change of the binding behaviour. The topology of the surface is also studied using participation ratio and structural entropy calculations.",
author = "{\'A}kos Nemcsics and Szilvia Nagy and Imre Mojzes and P{\'e}ter Turmezei",
year = "2009",
doi = "10.1109/SISY.2009.5291194",
language = "English",
isbn = "9781424453498",
pages = "65--67",
booktitle = "SISY 2009 - 7th International Symposium on Intelligent Systems and Informatics",

}

TY - GEN

T1 - Fractal and structural entropy calculations on the epitaxially grown fulleren structures with the help of image processing

AU - Nemcsics, Ákos

AU - Nagy, Szilvia

AU - Mojzes, Imre

AU - Turmezei, Péter

PY - 2009

Y1 - 2009

N2 - Molecular beam epitaxially grown fullerene layers are investigated with the help of image processing. The layered structures are studied in morphological respect. The individual layer morphologies are derived from the atomic force microscopy picture of the surface. The pattern morphology of the certain layers is analysed by box counting method. The surface morphology shows fractal behaviour. The pattern of each layer shows different dimension. The actual dimension depends on the actual distance of the layer from the substrate. The change of the dimension is attributed to the change of the binding behaviour. The topology of the surface is also studied using participation ratio and structural entropy calculations.

AB - Molecular beam epitaxially grown fullerene layers are investigated with the help of image processing. The layered structures are studied in morphological respect. The individual layer morphologies are derived from the atomic force microscopy picture of the surface. The pattern morphology of the certain layers is analysed by box counting method. The surface morphology shows fractal behaviour. The pattern of each layer shows different dimension. The actual dimension depends on the actual distance of the layer from the substrate. The change of the dimension is attributed to the change of the binding behaviour. The topology of the surface is also studied using participation ratio and structural entropy calculations.

UR - http://www.scopus.com/inward/record.url?scp=74349118119&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=74349118119&partnerID=8YFLogxK

U2 - 10.1109/SISY.2009.5291194

DO - 10.1109/SISY.2009.5291194

M3 - Conference contribution

AN - SCOPUS:74349118119

SN - 9781424453498

SP - 65

EP - 67

BT - SISY 2009 - 7th International Symposium on Intelligent Systems and Informatics

ER -