Electron diffraction based analysis of phase fractions and texture in nanocrystalline thin films, part III

Application examples

J. Lábár, M. Adamik, B. P. Barna, Z. Czigány, Zs Fogarassy, Z. Horváth, O. Geszti, F. Misják, J. Morgiel, G. Radnóczi, G. Sáfrán, L. Székely, T. Szüts

Research output: Article

37 Citations (Scopus)

Abstract

Abstract In this series of articles, a method is presented that performs (semi)quantitative phase analysis for nanocrystalline transmission electron microscope samples from selected area electron diffraction (SAED) patterns. Volume fractions and degree of fiber texture are determined for the nanocrystalline components. The effect of the amorphous component is minimized by empirical background interpolation. First, the two-dimensional SAED pattern is converted into a one-dimensional distribution similar to X-ray diffraction. Volume fractions of the nanocrystalline components are determined by fitting the spectral components, calculated for the previously identified phases with a priori known structures. These Markers are calculated not only for kinematic conditions, but the Blackwell correction is also applied to take into account dynamic effects for medium thicknesses. Peak shapes and experimental parameters (camera length, etc.) are refined during the fitting iterations. Parameter space is explored with the help of the Downhill-SIMPLEX. The method is implemented in a computer program that runs under the Windows operating system. Part I presented the principles, while part II elaborated current implementation. The present part III demonstrates the usage and efficiency of the computer program by numerous examples. The suggested experimental protocol should be of benefit in experiments aimed at phase analysis using electron diffraction methods.

Original languageEnglish
Pages (from-to)406-420
Number of pages15
JournalMicroscopy and Microanalysis
Volume18
Issue number2
DOIs
Publication statusPublished - ápr. 2012

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Electron diffraction
textures
electron diffraction
Textures
Thin films
Diffraction patterns
Computer program listings
Volume fraction
thin films
Windows operating system
diffraction patterns
computer programs
Interpolation
Kinematics
Electron microscopes
Cameras
markers
iteration
interpolation
Network protocols

ASJC Scopus subject areas

  • Instrumentation

Cite this

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title = "Electron diffraction based analysis of phase fractions and texture in nanocrystalline thin films, part III: Application examples",
abstract = "Abstract In this series of articles, a method is presented that performs (semi)quantitative phase analysis for nanocrystalline transmission electron microscope samples from selected area electron diffraction (SAED) patterns. Volume fractions and degree of fiber texture are determined for the nanocrystalline components. The effect of the amorphous component is minimized by empirical background interpolation. First, the two-dimensional SAED pattern is converted into a one-dimensional distribution similar to X-ray diffraction. Volume fractions of the nanocrystalline components are determined by fitting the spectral components, calculated for the previously identified phases with a priori known structures. These Markers are calculated not only for kinematic conditions, but the Blackwell correction is also applied to take into account dynamic effects for medium thicknesses. Peak shapes and experimental parameters (camera length, etc.) are refined during the fitting iterations. Parameter space is explored with the help of the Downhill-SIMPLEX. The method is implemented in a computer program that runs under the Windows operating system. Part I presented the principles, while part II elaborated current implementation. The present part III demonstrates the usage and efficiency of the computer program by numerous examples. The suggested experimental protocol should be of benefit in experiments aimed at phase analysis using electron diffraction methods.",
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author = "J. L{\'a}b{\'a}r and M. Adamik and Barna, {B. P.} and Z. Czig{\'a}ny and Zs Fogarassy and Z. Horv{\'a}th and O. Geszti and F. Misj{\'a}k and J. Morgiel and G. Radn{\'o}czi and G. S{\'a}fr{\'a}n and L. Sz{\'e}kely and T. Sz{\"u}ts",
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T1 - Electron diffraction based analysis of phase fractions and texture in nanocrystalline thin films, part III

T2 - Application examples

AU - Lábár, J.

AU - Adamik, M.

AU - Barna, B. P.

AU - Czigány, Z.

AU - Fogarassy, Zs

AU - Horváth, Z.

AU - Geszti, O.

AU - Misják, F.

AU - Morgiel, J.

AU - Radnóczi, G.

AU - Sáfrán, G.

AU - Székely, L.

AU - Szüts, T.

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KW - electron diffraction

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KW - quantitative analysis

KW - ring patterns

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KW - TEM

KW - texture

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