Determination of grain-boundary diffusion coefficients by Auger electron spectroscopy

Z. Erdélyi, Ch Girardeaux, G. A. Langer, L. Daróczi, A. Rolland, D. L. Beke

Research output: Conference article

18 Citations (Scopus)

Abstract

Surface accumulation method, called the Hwang-Balluffi method, was applied to measure the grain-boundary diffusion of Ag at low temperatures (413 and 428 K) in a nanocrystalline Cu film. Ag atoms from the Ag layer diffused through the copper nanocrystalline film along the grain boundaries to the opposite surface (i.e. the accumulation surface) where they spread out by rapid surface diffusion and accumulated. The rate of accumulation was detected by Auger Electron Spectroscopy (AES). It was shown that the results are not sensitive to the supposition whether accumulation takes place in one or two monolayers of the surface. TEM observations have been made in the same time before and after heat treatment to check the stability of the nanostructure.

Original languageEnglish
Pages (from-to)213-218
Number of pages6
JournalApplied Surface Science
Volume162
DOIs
Publication statusPublished - aug. 1 2000
Event5th International Symposium on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-5) - Provence, France
Duration: júl. 6 1999júl. 9 1999

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ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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