CONSIDERATION OF TWO DIMENSIONAL SURFACE ROUGHNESSES IN QUANTITATIVE XPS ANALYSIS.

Gy Varsanyi, Gy Mink, K. Ree, M. Mohai

Research output: Article

5 Citations (Scopus)

Abstract

The effect of two dimensional surface roughnesses on the intensities of XPS peaks have been investigated. The following models have been studied: square base pits with side walls perpendicular to the surface in chequered position, square base pyramid shaped pits touching each other by their edges, square base pyramids touching each other by their bottom edges, and spheres in closest packing with a planar tangent surface. On the latter model also the effect of ion etching has been studied. The application of the results are demonstrated on two quantitative surface analytical problems.

Original languageEnglish
Pages (from-to)3-17
Number of pages15
JournalPeriodica Polytechnica Chemical Engineering
Volume31
Issue number1-2
Publication statusPublished - jan. 1 1987

ASJC Scopus subject areas

  • Chemical Engineering(all)

Fingerprint Dive into the research topics of 'CONSIDERATION OF TWO DIMENSIONAL SURFACE ROUGHNESSES IN QUANTITATIVE XPS ANALYSIS.'. Together they form a unique fingerprint.

  • Cite this