Electron backscattering spectra are presented for graphite, Si, stainless steel, Ge, Mo, W and Au in the 0. 7-3 keV range. The percentage of elastically reflected electrons and the Auger excitation backscattering factors were determined. A simple expression is presented for evaluating AES analysis of thin overlayers, taking into consideration the backscattering excitation of the substrate. Some results are presented for iron and tungsten substrates.
|Number of pages||4|
|Publication status||Published - jan. 1 1980|
|Event||Unknown conference - Cannes, Fr|
Duration: szept. 22 1980 → szept. 26 1980
|Period||9/22/80 → 9/26/80|
ASJC Scopus subject areas