Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the inelastic mean free path and the surface excitation parameter

S. Gurban, G. Gergely, M. Menyhárd, J. Adam, M. Adamik, Cs Daroczi, J. Toth, D. Varga, A. Csík, B. Gruzza

Research output: Article

20 Citations (Scopus)

Abstract

Reference samples are needed for experimental determination of the inelastic mean free path (IMFP) of electrons by elastic peak electron spectroscopy (EPES). High-quality (microcrystalline mirror) Ni reference samples were used for IMFP measurements. For surface excitation parameter experiments, new types of reference samples are needed. They should exhibit pronounced surface-loss spectra, such as amorphous Ge (aGe), Sn and Ag. A new procedure is presented for their preparation. Microcrystalline Ag and Sn reference samples were deposited on highly polished (by Buehler alumina alpha micropolish 1C) brass (60% Cu, 40% Zn) substrates. Electrolytic deposition was used for Ag and for Sn and resulted in excellent surface quality. The average surface roughness rav was checked by scanning tunnelling microscopy or atomic force microscopy before and after Ar+ ion bombardment cleaning. Typical rav values were 4-6 nm for Ag, 3-4 nm for Sn and 2-4 nm for brass substrate. The aGe sample was deposited by magnetron sputtering or by evaporation in a high vacuum on an Si substrate. Its rav was 4-5 nm. The samples were studied by EPES/reflection electron energy-loss spectroscopy, covering the 0.2-5 keV energy range, with the ESA 31 HSA electron spectrometer. The IMFP of Sn was determined by EPES. The surface excitation parameters for the Si, Ge and Sn samples were determined from their inelastic scattering cross-section spectra. For Ag the surface excitation parameter was estimated by using the above reference samples.

Original languageEnglish
Pages (from-to)206-210
Number of pages5
JournalSurface and Interface Analysis
Volume34
Issue number1
DOIs
Publication statusPublished - aug. 2002

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Electron spectroscopy
mean free path
electron spectroscopy
Brass
excitation
Substrates
Inelastic scattering
Electrons
Aluminum Oxide
Electron energy loss spectroscopy
brasses
Scanning tunneling microscopy
Ion bombardment
Electrodeposition
Magnetron sputtering
Surface properties
Spectrometers
Cleaning
Atomic force microscopy
Evaporation

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Colloid and Surface Chemistry

Cite this

@article{56fd51a5e91445059a96348c5413da40,
title = "Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the inelastic mean free path and the surface excitation parameter",
abstract = "Reference samples are needed for experimental determination of the inelastic mean free path (IMFP) of electrons by elastic peak electron spectroscopy (EPES). High-quality (microcrystalline mirror) Ni reference samples were used for IMFP measurements. For surface excitation parameter experiments, new types of reference samples are needed. They should exhibit pronounced surface-loss spectra, such as amorphous Ge (aGe), Sn and Ag. A new procedure is presented for their preparation. Microcrystalline Ag and Sn reference samples were deposited on highly polished (by Buehler alumina alpha micropolish 1C) brass (60{\%} Cu, 40{\%} Zn) substrates. Electrolytic deposition was used for Ag and for Sn and resulted in excellent surface quality. The average surface roughness rav was checked by scanning tunnelling microscopy or atomic force microscopy before and after Ar+ ion bombardment cleaning. Typical rav values were 4-6 nm for Ag, 3-4 nm for Sn and 2-4 nm for brass substrate. The aGe sample was deposited by magnetron sputtering or by evaporation in a high vacuum on an Si substrate. Its rav was 4-5 nm. The samples were studied by EPES/reflection electron energy-loss spectroscopy, covering the 0.2-5 keV energy range, with the ESA 31 HSA electron spectrometer. The IMFP of Sn was determined by EPES. The surface excitation parameters for the Si, Ge and Sn samples were determined from their inelastic scattering cross-section spectra. For Ag the surface excitation parameter was estimated by using the above reference samples.",
keywords = "EPES, IMFP, Surface excitation",
author = "S. Gurban and G. Gergely and M. Menyh{\'a}rd and J. Adam and M. Adamik and Cs Daroczi and J. Toth and D. Varga and A. Cs{\'i}k and B. Gruzza",
year = "2002",
month = "8",
doi = "10.1002/sia.1284",
language = "English",
volume = "34",
pages = "206--210",
journal = "Surface and Interface Analysis",
issn = "0142-2421",
publisher = "John Wiley and Sons Ltd",
number = "1",

}

TY - JOUR

T1 - Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the inelastic mean free path and the surface excitation parameter

AU - Gurban, S.

AU - Gergely, G.

AU - Menyhárd, M.

AU - Adam, J.

AU - Adamik, M.

AU - Daroczi, Cs

AU - Toth, J.

AU - Varga, D.

AU - Csík, A.

AU - Gruzza, B.

PY - 2002/8

Y1 - 2002/8

N2 - Reference samples are needed for experimental determination of the inelastic mean free path (IMFP) of electrons by elastic peak electron spectroscopy (EPES). High-quality (microcrystalline mirror) Ni reference samples were used for IMFP measurements. For surface excitation parameter experiments, new types of reference samples are needed. They should exhibit pronounced surface-loss spectra, such as amorphous Ge (aGe), Sn and Ag. A new procedure is presented for their preparation. Microcrystalline Ag and Sn reference samples were deposited on highly polished (by Buehler alumina alpha micropolish 1C) brass (60% Cu, 40% Zn) substrates. Electrolytic deposition was used for Ag and for Sn and resulted in excellent surface quality. The average surface roughness rav was checked by scanning tunnelling microscopy or atomic force microscopy before and after Ar+ ion bombardment cleaning. Typical rav values were 4-6 nm for Ag, 3-4 nm for Sn and 2-4 nm for brass substrate. The aGe sample was deposited by magnetron sputtering or by evaporation in a high vacuum on an Si substrate. Its rav was 4-5 nm. The samples were studied by EPES/reflection electron energy-loss spectroscopy, covering the 0.2-5 keV energy range, with the ESA 31 HSA electron spectrometer. The IMFP of Sn was determined by EPES. The surface excitation parameters for the Si, Ge and Sn samples were determined from their inelastic scattering cross-section spectra. For Ag the surface excitation parameter was estimated by using the above reference samples.

AB - Reference samples are needed for experimental determination of the inelastic mean free path (IMFP) of electrons by elastic peak electron spectroscopy (EPES). High-quality (microcrystalline mirror) Ni reference samples were used for IMFP measurements. For surface excitation parameter experiments, new types of reference samples are needed. They should exhibit pronounced surface-loss spectra, such as amorphous Ge (aGe), Sn and Ag. A new procedure is presented for their preparation. Microcrystalline Ag and Sn reference samples were deposited on highly polished (by Buehler alumina alpha micropolish 1C) brass (60% Cu, 40% Zn) substrates. Electrolytic deposition was used for Ag and for Sn and resulted in excellent surface quality. The average surface roughness rav was checked by scanning tunnelling microscopy or atomic force microscopy before and after Ar+ ion bombardment cleaning. Typical rav values were 4-6 nm for Ag, 3-4 nm for Sn and 2-4 nm for brass substrate. The aGe sample was deposited by magnetron sputtering or by evaporation in a high vacuum on an Si substrate. Its rav was 4-5 nm. The samples were studied by EPES/reflection electron energy-loss spectroscopy, covering the 0.2-5 keV energy range, with the ESA 31 HSA electron spectrometer. The IMFP of Sn was determined by EPES. The surface excitation parameters for the Si, Ge and Sn samples were determined from their inelastic scattering cross-section spectra. For Ag the surface excitation parameter was estimated by using the above reference samples.

KW - EPES

KW - IMFP

KW - Surface excitation

UR - http://www.scopus.com/inward/record.url?scp=0036693794&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036693794&partnerID=8YFLogxK

U2 - 10.1002/sia.1284

DO - 10.1002/sia.1284

M3 - Article

VL - 34

SP - 206

EP - 210

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

SN - 0142-2421

IS - 1

ER -