A linear optical method for measuring the carrier envelope offset phase

Karoly Osvay, Mihaly Görbe, Christian Grebing, Günter Steinmeyer

Research output: Conference contribution

Abstract

A linear optical method is demonstrated for extracting the carrier-envelope offset phase via the fringe visibility in a combined two-path multi-path interferometer. This method is applicable to a wider class of lasers than f-to-2f interferometry.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2008
PublisherOptical Society of America
ISBN (Print)9781557528599
Publication statusPublished - jan. 1 2008
EventConference on Lasers and Electro-Optics, CLEO 2008 - San Jose, CA, United States
Duration: máj. 4 2008máj. 9 2008

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherConference on Lasers and Electro-Optics, CLEO 2008
CountryUnited States
CitySan Jose, CA
Period5/4/085/9/08

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Osvay, K., Görbe, M., Grebing, C., & Steinmeyer, G. (2008). A linear optical method for measuring the carrier envelope offset phase. In Conference on Lasers and Electro-Optics, CLEO 2008 (Optics InfoBase Conference Papers). Optical Society of America.