• 1323 Citations
  • 19 h-Index
19962020

Research output per year

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Research Output

2020

Determination of the complex dielectric function of ion-implanted amorphous germanium by spectroscopic ellipsometry

Lohner, T., Szilágyi, E., Zolnai, Z., Németh, A., Fogarassy, Z., Illés, L., Kótai, E., Petrik, P. & Fried, M., máj. 1 2020, In : Coatings. 10, 5, 480.

Research output: Article

Open Access

Dextran-based hydrogel layers for biosensors

Saftics, A., Türk, B., Sulyok, A., Nagy, N., Agócs, E., Kalas, B., Petrik, P., Fried, M., Khánh, N. Q., Prósz, A., Kamarás, K., Szekacs, I., Horvath, R. & Kurunczi, S., jan. 1 2020, Nanobiomaterial Engineering: Concepts and Their Applications in Biomedicine and Diagnostics. Springer Singapore, p. 139-164 26 p.

Research output: Chapter

High-quality PMMA/ZnO NWs piezoelectric coating on rigid and flexible metallic substrates

Chelu, M., Stroescu, H., Anastasescu, M., Calderon-Moreno, J. M., Preda, S., Stoica, M., Fogarassy, Z., Petrik, P., Gheorghe, M., Parvulescu, C., Brasoveanu, C., Dinescu, A., Moldovan, C. & Gartner, M., nov. 1 2020, In : Applied Surface Science. 529, 147135.

Research output: Article

Optimization of co-sputtered CrxAl1−xN thin films for piezoelectric MEMS devices

Soleimani, S., Kalas, B., Horváth, Z. E., Zolnai, Z., Czigány, Z., Németh, A., Petrik, P. & Volk, J., jún. 1 2020, In : Journal of Materials Science: Materials in Electronics. 31, 11, p. 8136-8143 8 p.

Research output: Article

2019

Changes in composite nc-Si-SiO2 thin films caused by 20 MeV electron irradiation

Nesheva, D., Petrik, P., Hristova-Vasileva, T., Fogarassy, Z., Kalas, B., Šćepanović, M., Kaschieva, S., Dmitriev, S. N. & Antonova, K., jan. 1 2019, In : Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms.

Research output: Article

Optical Properties of Oxidized, Hydrogenated, and Native Zirconium Surfaces for Wavelengths from 0.3 to 25 µm − A Study by Ex Situ and In Situ Spectroscopic Ellipsometry

Petrik, P., Romanenko, A., Kalas, B., Péter, L., Novotny, T., Perez-Feró, E., Fodor, B., Agocs, E., Lohner, T., Kurunczi, S., Stoica, M., Gartner, M. & Hózer, Z., jan. 1 2019, In : Physica Status Solidi (A) Applications and Materials Science. 1800676.

Research output: Article

Pulsed laser deposition of aluminum nitride films: Correlation between mechanical, optical, and structural properties

Kolaklieva, L., Chitanov, V., Szekeres, A., Antonova, K., Terziyska, P., Fogarassy, Z., Petrik, P., Mihailescu, I. N. & Duta, L., 2019, In : Coatings. 9, 3, 195.

Research output: Article

Open Access
2 Citations (Scopus)

Swift heavy ion irradiated planar waveguides in a rare earth doped tungsten Tellurite glass and a tungstate crystal

Bányász, I., Nagy, G. U. L., Rajta, I., Havránek, V., Vosecek, V., Fried, M., Petrik, P., Agócs, E., Kalas, B., Veres, M. & Holomb, R., dec. 10 2019, Proceedings of the International Conference of Computational Methods in Sciences and Engineering 2019, ICCMSE 2019. Simos, T. E., Simos, T. E., Simos, T. E., Kalogiratou, Z. & Monovasilis, T. (eds.). American Institute of Physics Inc., 040002. (AIP Conference Proceedings; vol. 2186).

Research output: Conference contribution

2018

Electrochemical Sensors for Detection of Different Ionic Species (Nitrites/Nitrates and Heavy Metals) in Natural Water Sources

Gartner, M., Lete, C., Chelu, M., Stroescu, H., Zaharescu, M., Moldovan, C., Brasoveanu, C., Gheorghe, M., Gheorghe, S., Duta, A., Labadi, Z., Kalas, B., Saftics, A., Fried, M., Petrik, P., Toth, E., Jankovics, H. & Vonderviszt, F., nov. 16 2018, 2018 41st International Semiconductor Conference, CAS 2018 - Proceedings. Dinescu, M. A., Dobrescu, D., Muller, A., Cristea, D., Dragoman, M., Muller, R., Ciurea, M. L., Neculoiu, D. & Brezeanu, G. (eds.). Institute of Electrical and Electronics Engineers Inc., Vol. 2018-October. p. 329-332 4 p. 8539739

Research output: Conference contribution

4 Citations (Scopus)

Influence of 20 MeV electron irradiation on the optical properties and phase composition of SiOx thin films

Hristova-Vasileva, T., Petrik, P., Nesheva, D., Fogarassy, Z., Lábár, J., Kaschieva, S., Dmitriev, S. N. & Antonova, K., máj. 21 2018, In : Journal of Applied Physics. 123, 19, 195303.

Research output: Article

2 Citations (Scopus)
1 Citation (Scopus)

Solar cells with photonic and plasmonic structures

Petrik, P., jan. 1 2018, Springer Series in Optical Sciences. Springer Verlag, p. 509-522 14 p. (Springer Series in Optical Sciences; vol. 212).

Research output: Chapter

2017

Design, Ion beam fabrication and test of integrated optical elements

Bányász, I., Pelli, S., Nunzi-Conti, G., Righini, G. C., Berneschi, S., Szilágyi, E., Németh, A., Fried, M., Petrik, P., Agócs, E., Kalas, B., Zolnai, Z., Khanh, N. Q., Rajta, I., Nagy, G. U. L., Havranek, V., Vosecek, V., Veres, M. & Himics, L., jan. 1 2017, PHOTOPTICS 2018 - Proceedings of the 6th International Conference on Photonics, Optics and Laser Technology. Ribeiro, P. A. & Raposo, M. (eds.). SciTePress, Vol. 2017-January. p. 279-285 7 p.

Research output: Conference contribution

Ellipsometric and X-Ray Spectrometric Investigation of Fibrinogen Protein Layers

Kalas, B., Pollakowski, B., Nutsch, A., Streeck, C., Nador, J., Fried, M., Beckhoff, B. & Petrik, P., dec. 1 2017, In : Physica Status Solidi (C) Current Topics in Solid State Physics. 14, 12, 1700210.

Research output: Article

1 Citation (Scopus)

Nanophotonics of biomaterials and inorganic nanostructures

Petrik, P., Agocs, E., Kalas, B., Fodor, B., Lohner, T., Nador, J., Saftics, A., Kurunczi, S., Novotny, T., Perez-Feró, E., Nagy, R., Hamori, A., Horvath, R., Hózer, Z. & Fried, M., febr. 22 2017, In : Journal of Physics: Conference Series. 794, 1, 012004.

Research output: Conference article

Optical and structural characterization of Ge clusters embedded in ZrO 2

Agocs, E., Zolnai, Z., Rossall, A. K., van den Berg, J. A., Fodor, B., Lehninger, D., Khomenkova, L., Ponomaryov, S., Gudymenko, O., Yukhymchuk, V., Kalas, B., Heitmann, J. & Petrik, P., nov. 1 2017, In : Applied Surface Science. 421, p. 283-288 6 p.

Research output: Article

2 Citations (Scopus)

Protein adsorption monitored by plasmon-enhanced semi-cylindrical Kretschmann ellipsometry

Kalas, B., Nador, J., Agocs, E., Saftics, A., Kurunczi, S., Fried, M. & Petrik, P., nov. 1 2017, In : Applied Surface Science. 421, p. 585-592 8 p.

Research output: Article

5 Citations (Scopus)

Spectroellipsometric detection of silicon substrate damage caused by radiofrequency sputtering of niobium oxide

Lohner, T., Serényi, M., Szilágyi, E., Zolnai, Z., Czigány, Z., Khánh, N. Q., Petrik, P. & Fried, M., nov. 1 2017, In : Applied Surface Science. 421, p. 636-642 7 p.

Research output: Article

Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires

Fodor, B., Defforge, T., Agócs, E., Fried, M., Gautier, G. & Petrik, P., nov. 1 2017, In : Applied Surface Science. 421, p. 397-404 8 p.

Research output: Article

8 Citations (Scopus)

TEM and AFM studies of aluminium nitride films synthesized by pulsed laser deposition

Fogarassy, Z., Petrik, P., Duta, L., Mihailescu, I. N., Anastasescu, M., Gartner, M., Antonova, K. & Szekeres, A., dec. 1 2017, In : Applied Physics A: Materials Science and Processing. 123, 12, 756.

Research output: Article

1 Citation (Scopus)
2016
9 Citations (Scopus)

Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions

Agocs, E., Kozma, P., Nador, J., Hamori, A., Janosov, M., Kalas, B., Kurunczi, S., Fodor, B., Ehrentreich-Förster, E., Fried, M., Horváth, R. & Petrik, P., jún. 15 2016, (Accepted/In press) In : Applied Surface Science.

Research output: Article

3 Citations (Scopus)

Optical properties of Zr and ZrO2

Petrik, P., Sulyok, A., Novotny, T., Perez-Feró, E., Kalas, B., Agocs, E., Lohner, T., Lehninger, D., Khomenkova, L., Nagy, R., Heitmann, J., Menyhard, M. & Hózer, Z., júl. 31 2016, (Accepted/In press) In : Applied Surface Science.

Research output: Article

4 Citations (Scopus)

Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion, and polyelectrolyte deposition on titania nanostructures

Nador, J., Kalas, B., Saftics, A., Agocs, E., Kozma, P., Kõrösi, L., Szekacs, I., Fried, M., Horváth, R. & Petrik, P., márc. 7 2016, In : Optics Express. 24, 5, p. 4812-4823 12 p.

Research output: Article

9 Citations (Scopus)

Porosity and thickness characterization of porous Si and oxidized porous Si layers - An ultraviolet-visible-mid infrared ellipsometry study

Fodor, B., Agocs, E., Bardet, B., Defforge, T., Cayrel, F., Alquier, D., Fried, M., Gautier, G. & Petrik, P., jún. 2016, In : Microporous and Mesoporous Materials. 227, p. 112-120 9 p.

Research output: Article

13 Citations (Scopus)

Ultrafast laser plasma assisted rare-earth doping for silicon photonics

Jose, G., Chandrappan, J., Kamil, S. A., Murray, M., Zolnai, Z., Agocs, E., Petrik, P., Steenson, P. & Krauss, T., dec. 16 2016, 2016 Conference on Lasers and Electro-Optics, CLEO 2016. Institute of Electrical and Electronics Engineers Inc., 7787390. (2016 Conference on Lasers and Electro-Optics, CLEO 2016).

Research output: Conference contribution

2015

Doping silica beyond limits with laser plasma for active photonic materials

Chandrappan, J., Murray, M., Petrik, P., Agocs, E., Zolnai, Z., Tempez, A., Legendre, S., Steenson, D. P., Jha, A. & Jose, G., 2015, In : Optical Materials Express. 5, 12, p. 2849-2861 13 p.

Research output: Article

11 Citations (Scopus)

Expanded beam spectro-ellipsometry for big area on-line monitoring

Fried, M., Major, C., Juhasz, G., Petrik, P. & Horvath, Z., 2015, Proceedings of SPIE - The International Society for Optical Engineering. SPIE, Vol. 9525. 95251S

Research output: Conference contribution

Fourier ellipsometry - An ellipsometric approach to Fourier scatterometry

Petrik, P., Kumar, N., Fried, M., Fodor, B., Juhasz, G., Pereira, S. F., Burger, S. & Urbach, H. P., jan. 29 2015, In : Journal of the European Optical Society. 10, 15002.

Research output: Article

6 Citations (Scopus)

Methods for optical modeling and cross-checking in ellipsometry and scatterometry

Petrik, P., Fodor, B., Agocs, E., Kozma, P., Nador, J., Kumar, N., Endres, J., Juhasz, G., Major, C., Pereira, S. F., Lohner, T., Urbach, H. P., Bodermann, B. & Fried, M., jan. 1 2015, Modeling Aspects in Optical Metrology V. Silver, R. M., Bodermann, B. & Frenner, K. (eds.). SPIE, 95260S. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 9526).

Research output: Conference contribution

1 Citation (Scopus)

Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes

Petrik, P., Agocs, E., Kalas, B., Kozma, P., Fodor, B., Nador, J., Major, C. & Fried, M., jan. 1 2015, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials II. Grilli, S., Ferraro, P., Ritsch-Marte, M. & Stifter, D. (eds.). SPIE, 95290W. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 9529).

Research output: Conference contribution

2 Citations (Scopus)

Refractive index and interband transitions in strain modified NaNbO3 thin films grown by MOCVD

Bin Anooz, S., Petrik, P., Schmidbauer, M., Remmele, T. & Schwarzkopf, J., szept. 30 2015, In : Journal of Physics D: Applied Physics. 48, 38, 385303.

Research output: Article

1 Citation (Scopus)

Target dependent femtosecond laser plasma implantation dynamics in enabling silica for high density erbium doping

Chandrappan, J., Murray, M., Kakkar, T., Petrik, P., Agocs, E., Zolnai, Z., Steenson, D. P., Jha, A. & Jose, G., szept. 15 2015, In : Scientific reports. 5, 14037.

Research output: Article

15 Citations (Scopus)
2014

Approaches to calculate the dielectric function of ZnO around the band gap

Agocs, E., Fodor, B., Pollakowski, B., Beckhoff, B., Nutsch, A., Jank, M. & Petrik, P., nov. 28 2014, In : Thin Solid Films. 571, P3, p. 684-688 5 p.

Research output: Article

14 Citations (Scopus)

Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride

Fodor, B., Cayrel, F., Agocs, E., Alquier, D., Fried, M. & Petrik, P., nov. 28 2014, In : Thin Solid Films. 571, P3, p. 567-572 6 p.

Research output: Article

2 Citations (Scopus)

Composite polymeric-inorganic waveguide fabricated by injection molding for biosensing applications

Dortu, F., Bernier, D., Cestier, I., Vandormael, D., Emmerechts, C., Fissi, L. E., Francis, L., Nittler, L., Houssiau, L., Fodor, B., Agocs, E., Petrik, P. & Fried, M., jan. 1 2014, ICTON 2014 - 16th International Conference on Transparent Optical Networks. IEEE Computer Society, 6876325. (International Conference on Transparent Optical Networks).

Research output: Conference contribution

1 Citation (Scopus)

Enabling silica for high density rare earth doping for integrated optoelectronic systems

Chandrappan, J., Murray, M., Petrik, P., Agocs, E., Zolnai, Z., Steenson, D. P., Jha, A. & Jose, G., júl. 21 2014, European Conference on Lasers and Electro-Optics, CLEO 2015. OSA - The Optical Society

Research output: Conference contribution

High-speed imaging/mapping spectroscopic ellipsometry for in-line analysis of roll-to-roll thin-film photovoltaics

Shan, A., Fried, M., Juhász, G., Major, C., Polgár, O., Németh, Á., Petrik, P., Dahal, L. R., Chen, J., Huang, Z., Podraza, N. J. & Collins, R. W., jan. 1 2014, In : IEEE Journal of Photovoltaics. 4, 1, p. 355-361 7 p., 6644259.

Research output: Article

23 Citations (Scopus)

Measurement comparison of goniometric scatterometry and coherent Fourier scatterometry

Endres, J., Kumar, N., Petrik, P., Henn, M. A., Heidenreich, S., Pereira, S. F., Urbach, H. P. & Bodermann, B., jan. 1 2014, Optical Micro- and Nanometrology V. SPIE, 913208. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 9132).

Research output: Conference contribution

7 Citations (Scopus)
15 Citations (Scopus)

Optical characterization of gold-cuprous oxide interfaces for terahertz emission applications

Ramanandan, G. K. P., Adam, A. J. L., Ramakrishnan, G., Petrik, P., Hendrikx, R. & Planken, P. C. M., ápr. 1 2014, In : Applied Optics. 10, p. 1994-2000 7 p.

Research output: Article

2 Citations (Scopus)

Optical characterization of laterally and vertically structured oxides and semiconductors

Petrik, P., Kumar, N., Agocs, E., Fodor, B., Pereira, S. F., Lohner, T., Fried, M. & Urbach, H. P., jan. 1 2014, Oxide-Based Materials and Devices V. SPIE, 89870E. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 8987).

Research output: Conference contribution

Optical characterization of macro-, micro- and nanostructures using polarized light

Petrik, P., Kumar, N., Juhasz, G., Major, C., Fodor, B., Agocs, E., Lohner, T., Pereira, S. F., Urbach, H. P. & Fried, M., 2014, In : Journal of Physics: Conference Series. 558, 1, 012008.

Research output: Conference article

6 Citations (Scopus)

Optical characterization of patterned thin films

Rosu, D., Petrik, P., Rattmann, G., Schellenberger, M., Beck, U. & Hertwig, A., nov. 28 2014, In : Thin Solid Films. 571, P3, p. 601-604 4 p.

Research output: Article

2 Citations (Scopus)

Optical polymers with tunable refractive index for nanoimprint technologies

Landwehr, J., Fader, R., Rumler, M., Rommel, M., Bauer, A. J., Frey, L., Simon, B., Fodor, B., Petrik, P., Schiener, A., Winter, B. & Spiecker, E., dec. 19 2014, In : Nanotechnology. 25, 50, 505301.

Research output: Article

4 Citations (Scopus)
12 Citations (Scopus)

Reconstruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier scatterometry

Kumar, N., Petrik, P., Ramanandan, G. K. P., El Gawhary, O., Roy, S., Pereira, S. F., Coene, W. M. J. & Urbach, H. P., okt. 6 2014, In : Optics Express. 22, 20, p. 24678-24688 11 p.

Research output: Article

21 Citations (Scopus)