• 1829 Citations
  • 21 h-Index
1971 …2019

Research output per year

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Research Output

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Article
2019
2 Citations (Scopus)

Novel method for the production of SiC micro and nanopatterns

Racz, A. S., Zambo, D., Dobrik, G., Lukacs, I., Zolnai, Z., Nemeth, A., Panjan, P., Deák, A., Battistig, G. & Menyhárd, M., aug. 25 2019, In : Surface and Coatings Technology. 372, p. 427-433 7 p.

Research output: Article

2018
4 Citations (Scopus)
3 Citations (Scopus)
2017
4 Citations (Scopus)

Phase formation sequence in the Ti/InP system during thin film solid-state reactions

Ghegin, E., Rodriguez, P., Lábár, J. L., Menyhárd, M., Favier, S., Sagnes, I. & Nemouchi, F., jún. 28 2017, In : Journal of Applied Physics. 121, 24, 245311.

Research output: Article

6 Citations (Scopus)
2016
3 Citations (Scopus)

Wafer-scale SiC rich nano-coating layer by Ar+ and Xe+ ion mixing

Battistig, G., Gurbán, S., Sáfrán, G., Sulyok, A., Németh, A., Panjan, P., Zolnai, Z. & Menyhárd, M., szept. 25 2016, In : Surface and Coatings Technology. 302, p. 320-326 7 p.

Research output: Article

4 Citations (Scopus)
2015

The chemical resistance of nano-sized SiC rich composite coating

Gurbán, S., Kotis, L., Pongracz, A., Sulyok, A., Tóth, A. L., Vázsonyi, E. & Menyhard, M., jan. 15 2015, In : Surface and Coatings Technology. 261, p. 195-200 6 p.

Research output: Article

5 Citations (Scopus)
2014
4 Citations (Scopus)

Examination of nanocrystalline TiC/amorphous C deposited thin films

Oláh, N., Veres, M., Sulyok, A., Menyhárd, M., Gubicza, J. & Balázsi, K., nov. 2014, In : Journal of the European Ceramic Society. 34, 14, p. 3421-3425 5 p.

Research output: Article

9 Citations (Scopus)

Texture change of TiN films due to anisotropic incorporation of oxygen

Biro, D., Hasaneen, M. F., Székely, L., Menyhárd, M., Gurbán, S., Pekker, P., Dódony, I. & Barna, P. B., máj. 1 2014, In : Vacuum. 103, p. 78-86 9 p.

Research output: Article

9 Citations (Scopus)
2013
3 Citations (Scopus)
2 Citations (Scopus)

Structural, mechanical and biological comparison of TiC and TiCN nanocomposites films

Balázsi, K., Lukács, I. E., Gurbán, S., Menyhárd, M., Bacáková, L., Vandrovcová, M. & Balázsi, C., okt. 1 2013, In : Journal of the European Ceramic Society. 33, 12, p. 2217-2221 5 p.

Research output: Article

19 Citations (Scopus)
2012

Growth of amorphous SiC film on Si by means of ion beam induced mixing

Barna, Á., Gurban, S., Kotis, L., Lábár, J., Sulyok, A., Tóth, A. L., Menyhárd, M., Kovac, J. & Panjan, P., dec. 15 2012, In : Applied Surface Science. 263, p. 367-372 6 p.

Research output: Article

13 Citations (Scopus)

In-depth distribution of ion beam damage in SiC

Sulyok, A., Menyhárd, M. & Malherbe, J. B., jan. 27 2012, In : Vacuum. 86, 6, p. 761-764 4 p.

Research output: Article

2 Citations (Scopus)

Passivation of GaAs(001) surface by the growth of high quality c-GaN ultra-thin film using low power glow discharge nitrogen plasma source

Monier, G., Bideux, L., Robert-Goumet, C., Gruzza, B., Petit, M., Lábár, J. L. & Menyhárd, M., júl. 1 2012, In : Surface Science. 606, 13-14, p. 1093-1099 7 p.

Research output: Article

16 Citations (Scopus)

Thin TaC layer produced by ion mixing

Barna, Á., Kotis, L., Pécz, B., Sulyok, A., Sáfrán, G., Tóth, A. L., Menyhárd, M., Kovács, A. & Savenko, A., máj. 25 2012, In : Surface and Coatings Technology. 206, 19-20, p. 3917-3922 6 p.

Research output: Article

5 Citations (Scopus)
2011
3 Citations (Scopus)
5 Citations (Scopus)
2010

Simulation and measurement of AES depth profiles; a case study of the C/Ta/C/Si system

Zommer, L., Jablonski, A., Kotis, L., Safran, G. & Menyhárd, M., ápr. 15 2010, In : Surface Science. 604, 7-8, p. 633-640 8 p.

Research output: Article

3 Citations (Scopus)
2009
9 Citations (Scopus)
5 Citations (Scopus)
6 Citations (Scopus)

The inelastic mean free path of electrons. Past and present research

Gergely, G., Gurban, S., Menyhard, M., Jablonski, A., Zommer, L. & Goto, K., aug. 25 2009, In : Vacuum. 84, 1, p. 134-136 3 p.

Research output: Article

5 Citations (Scopus)
2008
10 Citations (Scopus)

Ion mixing at 20 keV: A comparison of the effects of Ga+, Ar+ and CF4+ ion irradiation

Barna, A., Gurban, S., Kotis, L., Toth, A. L. & Menyhard, M., dec. 1 2008, In : Ultramicroscopy. 109, 1, p. 129-132 4 p.

Research output: Article

1 Citation (Scopus)

Monte Carlo calculation of backscattering factor for Ni-C multilayer system

Zommer, L., Jablonski, A., Kotis, L. & Menyhárd, M., aug. 7 2008, In : Journal of Physics D: Applied Physics. 41, 15, 155312.

Research output: Article

6 Citations (Scopus)
Open Access
1 Citation (Scopus)
2007

Asymmetric transient enhanced intermixing in Pt/Ti

Süle, P., Menyhárd, M., Kótis, L., Lábár, J. & Egelhoff, W. F., márc. 12 2007, In : Journal of Applied Physics. 101, 4, 043502.

Research output: Article

15 Citations (Scopus)

Determination of relative sputtering yield of Cr/Si

Kotis, L., Menyhard, M., Toth, L., Zalar, A. & Panjan, P., okt. 29 2007, In : Vacuum. 82, 2 SPEC. ISS., p. 178-181 4 p.

Research output: Article

8 Citations (Scopus)
4 Citations (Scopus)
6 Citations (Scopus)
3 Citations (Scopus)

Ion beam mixing by focused ion beam

Barna, Á., Kotis, L., Lábár, J. L., Osváth, Z., Tóth, A. L., Menyhárd, M., Zalar, A. & Panjan, P., szept. 20 2007, In : Journal of Applied Physics. 102, 5, 053513.

Research output: Article

12 Citations (Scopus)

Stability of ZnO{0 0 0 1} against low energy ion bombardment

Sulyok, A., Menyhard, M. & Malherbe, J. B., ápr. 15 2007, In : Surface Science. 601, 8, p. 1857-1861 5 p.

Research output: Article

9 Citations (Scopus)
2006
1 Citation (Scopus)
11 Citations (Scopus)

Influence of layer microstructure on the double nucleation process in Cu/Mg multilayers

Gonzalez-Silveira, M., Rodriguez-Viejo, J., Garcia, G., Pi, F., Ager, F. J., Lábár, J. L., Barna, A., Menyhárd, M. & Kótis, L., 2006, In : Journal of Applied Physics. 100, 11, 113522.

Research output: Article

5 Citations (Scopus)

Surface excitation correction of the inelastic mean free path in selected conducting polymers

Gergely, G., Menyhard, M., Orosz, G. T., Lesiak, B., Kosinski, A., Jablonski, A., Nowakowski, R., Tóth, J. & Varga, D., máj. 15 2006, In : Applied Surface Science. 252, 14, p. 4982-4989 8 p.

Research output: Article

6 Citations (Scopus)
2005
4 Citations (Scopus)

Inelastic mean free path data for Si corrected for surface excitation

Orosz, G. T., Gergely, G., Gurbán, S., Menyhard, M. & Jablonski, A., dec. 1 2005, In : Microscopy and Microanalysis. 11, 6, p. 581-585 5 p.

Research output: Article

Ion bombardment induced interface broadening in Co/Cu system as a function of layer thickness

Barna, A., Menyhard, M., Zalar, A. & Panjan, P., ápr. 15 2005, In : Applied Surface Science. 242, 3-4, p. 375-379 5 p.

Research output: Article

7 Citations (Scopus)
15 Citations (Scopus)

Unexpectedly high sputtering yield of carbon at grazing angle of incidence ion bombardment

Barna, A., Menyhard, M., Kotis, L., Kovacs, G. J., Radnoczi, G., Zalar, A. & Panjan, P., júl. 15 2005, In : Journal of Applied Physics. 98, 2, 024901.

Research output: Article

13 Citations (Scopus)
2004
9 Citations (Scopus)
24 Citations (Scopus)
4 Citations (Scopus)
16 Citations (Scopus)