• 1835 Citations
  • 21 h-Index
1971 …2019

Research output per year

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Research Output

Article
100 Citations (Scopus)
12 Citations (Scopus)
10 Citations (Scopus)

Asymmetric transient enhanced intermixing in Pt/Ti

Süle, P., Menyhárd, M., Kótis, L., Lábár, J. & Egelhoff, W. F., márc. 12 2007, In : Journal of Applied Physics. 101, 4, 043502.

Research output: Article

16 Citations (Scopus)
48 Citations (Scopus)
1 Citation (Scopus)
8 Citations (Scopus)
1 Citation (Scopus)
10 Citations (Scopus)

Auger spectrometric studies on fracture surfaces of tool steel

Romhányi, K., Csih, Z. S., Gergely, G. & Menyhárd, M., 1980, In : Crystal Research and Technology. 15, 4, p. 471-477 7 p.

Research output: Article

4 Citations (Scopus)

Backscattering spectra of medium energy electrons

Gergely, G., Gruzza, B. & Menyhárd, M., aug. 1 1980, In : Acta Physica Academiae Scientiarum Hungaricae. 48, 4, p. 337-348 12 p.

Research output: Article

20 Citations (Scopus)
4 Citations (Scopus)

CHARGING OF NaCl UNDER LOW ENERGY ELECTRON BOMBARDMENT.

Gergely, G. & Menyhard, M., jan. 1 1975, In : Acta Tech (Budap). 80, 1-2, p. 309-315 7 p.

Research output: Article

1 Citation (Scopus)
9 Citations (Scopus)
4 Citations (Scopus)
3 Citations (Scopus)

Demixing in spin valve structures: an Auger depth profiling study

Menyhard, M., Sulyok, A., Pentek, K. & Zeltser, A. M., máj. 1 2000, In : Thin Solid Films. 366, 1-2, p. 129-134 6 p.

Research output: Article

7 Citations (Scopus)
3 Citations (Scopus)
3 Citations (Scopus)

Determination of effective electron inelastic mean free paths in SiO 2 and Si3N4 using a Si reference

Jung, R., Lee, J. C., Orosz, G. T., Sulyok, A., Zsolt, G. & Menyhard, M., okt. 1 2003, In : Surface Science. 543, 1-3, p. 153-161 9 p.

Research output: Article

19 Citations (Scopus)

Determination of grain boundary segregation by surface studies

Menyhard, M., jún. 1978, In : Scripta Metallurgica. 12, 6, p. 499-502 4 p.

Research output: Article

Determination of inelastic mean free paths for AuPd alloys by elastic peak electron spectroscopy (EPES)

Zommer, L., Jablonski, A., Krawczyk, M., Kövér, L., Varga, D., Tóth, J., Bendek, S., Sulyok, A., Menyhard, M., Gergely, G., Robert, C. & Gruzza, B., jan. 2002, In : Surface and Interface Analysis. 33, 1, p. 23-28 6 p.

Research output: Article

14 Citations (Scopus)
20 Citations (Scopus)

Determination of relative sputtering yield of Cr/Si

Kotis, L., Menyhard, M., Toth, L., Zalar, A. & Panjan, P., okt. 29 2007, In : Vacuum. 82, 2 SPEC. ISS., p. 178-181 4 p.

Research output: Article

8 Citations (Scopus)
28 Citations (Scopus)
21 Citations (Scopus)
6 Citations (Scopus)
10 Citations (Scopus)
14 Citations (Scopus)
1 Citation (Scopus)
9 Citations (Scopus)
1 Citation (Scopus)
4 Citations (Scopus)
4 Citations (Scopus)
8 Citations (Scopus)
6 Citations (Scopus)
12 Citations (Scopus)
4 Citations (Scopus)

Electron microscopic and AES studies on thin layers of NiCr

Tóth, L., Barna, A., Sáfrán, G., Menyhárd, M. & Korányi, T., jan. 1 1983, In : Vacuum. 33, 1-2, p. 111-115 5 p.

Research output: Article

13 Citations (Scopus)
7 Citations (Scopus)
11 Citations (Scopus)
4 Citations (Scopus)

Examination of nanocrystalline TiC/amorphous C deposited thin films

Oláh, N., Veres, M., Sulyok, A., Menyhárd, M., Gubicza, J. & Balázsi, K., nov. 2014, In : Journal of the European Ceramic Society. 34, 14, p. 3421-3425 5 p.

Research output: Article

9 Citations (Scopus)
6 Citations (Scopus)

Experimental determination of electron inelastic scattering cross-sections in Si, Ge and III-V semiconductors

Orosz, G. T., Gergely, G., Gurban, S., Menyhard, M., Toth, J., Varga, D. & Tougaard, S., máj. 9 2003, In : Vacuum. 71, 1-2 SPEC., p. 147-152 6 p.

Research output: Article

13 Citations (Scopus)
3 Citations (Scopus)
30 Citations (Scopus)
12 Citations (Scopus)
31 Citations (Scopus)