• 1916 Citations
  • 22 h-Index
1982 …2020

Research output per year

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Research Output

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Conference article
2017

Nanophotonics of biomaterials and inorganic nanostructures

Petrik, P., Agocs, E., Kalas, B., Fodor, B., Lohner, T., Nador, J., Saftics, A., Kurunczi, S., Novotny, T., Perez-Feró, E., Nagy, R., Hamori, A., Horvath, R., Hózer, Z. & Fried, M., febr. 22 2017, In : Journal of Physics: Conference Series. 794, 1, 012004.

Research output: Conference article

2014

Optical characterization of macro-, micro- and nanostructures using polarized light

Petrik, P., Kumar, N., Juhasz, G., Major, C., Fodor, B., Agocs, E., Lohner, T., Pereira, S. F., Urbach, H. P. & Fried, M., 2014, In : Journal of Physics: Conference Series. 558, 1, 012008.

Research output: Conference article

6 Citations (Scopus)
2008
2 Citations (Scopus)
2 Citations (Scopus)
4 Citations (Scopus)

Ellipsometric characterization of flagellin films for biosensor applications

Kozma, P., Nagy, N., Kurunczi, S., Petrik, P., Hámori, A., Muskotál, A., Vonderviszt, F., Fried, M. & Bársony, I., dec. 1 2008, In : Physica Status Solidi (C) Current Topics in Solid State Physics. 5, 5, p. 1427-1430 4 p.

Research output: Conference article

12 Citations (Scopus)
8 Citations (Scopus)

Non-collimated beam ellipsometry

Juhász, G., Horváth, Z., Major, C., Petrik, P., Polgár, O. & Fried, M., dec. 1 2008, In : Physica Status Solidi (C) Current Topics in Solid State Physics. 5, 5, p. 1081-1084 4 p.

Research output: Conference article

24 Citations (Scopus)

Spectroscopic ellipsometric study of Ge nanocrystals embedded in SiO 2 using parametric models

Basa, P., Petrik, P., Fried, M., Dâna, A., Aydinli, A., Foss, S. & Finstad, T. G., dec. 1 2008, In : Physica Status Solidi (C) Current Topics in Solid State Physics. 5, 5, p. 1332-1336 5 p.

Research output: Conference article

4 Citations (Scopus)

Wide angle beam ellipsometry for extremely large samples

Major, C., Juhász, G., Horváth, Z., Polgar, O. & Fried, M., dec. 1 2008, In : Physica Status Solidi (C) Current Topics in Solid State Physics. 5, 5, p. 1077-1080 4 p.

Research output: Conference article

17 Citations (Scopus)
2004

Depth distribution of disorder and cavities in high dose helium implanted silicon characterized by spectroscopic ellipsometry

Petrik, P., Cayrel, F., Fried, M., Polgár, O., Lohner, T., Vincent, L., Alquier, D. & Gyulai, J., máj. 1 2004, In : Thin Solid Films. 455-456, p. 344-348 5 p.

Research output: Conference article

4 Citations (Scopus)

Dose-dependence of ion implantation-caused damage in silicon measured by ellipsometry and backscattering spectrometry

Fried, M., Petrik, P., Lohner, T., Khánh, N. Q., Polgár, O. & Gyulai, J., máj. 1 2004, In : Thin Solid Films. 455-456, p. 404-409 6 p.

Research output: Conference article

13 Citations (Scopus)

Evaluation of ellipsometric measurements using complex strategies

Polgár, O., Fried, M., Lohner, T. & Bársony, I., máj. 1 2004, In : Thin Solid Films. 455-456, p. 95-100 6 p.

Research output: Conference article

9 Citations (Scopus)

Ion implantation-caused damage in SiC measured by spectroscopic ellipsometry

Petrik, P., Shaaban, E. R., Lohner, T., Battistig, G., Fried, M., Lopez, J. G., Morilla, Y., Polgár, O. & Gyulai, J., máj. 1 2004, In : Thin Solid Films. 455-456, p. 239-243 5 p.

Research output: Conference article

4 Citations (Scopus)

Optical characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films

Schmidt, C., Petrik, P., Schneider, C., Fried, M., Lohner, T., Bársony, I., Gyulai, J. & Ryssel, H., máj. 1 2004, In : Thin Solid Films. 455-456, p. 495-499 5 p.

Research output: Conference article

6 Citations (Scopus)

The ideal vehicle for optical model development: Porous silicon multilayers

Volk, J., Fried, M., Tóth, A. L. & Bársony, I., máj. 1 2004, In : Thin Solid Films. 455-456, p. 535-539 5 p.

Research output: Conference article

7 Citations (Scopus)

Thin Solid Films: Preface

Fried, M., Hingeri, K. & Humlíček, J., máj. 1 2004, In : Thin Solid Films. 455-456, p. 1-2 2 p.

Research output: Conference article

2003
13 Citations (Scopus)
2002

Ellipsometric study of ion-implantation damage in single-crystal silicon - An advanced optical model

Petrik, P., Polgár, O., Lohner, T., Fried, M., Khánh, N. Q. & Gyulai, J., jan. 1 2002, In : Solid State Phenomena. 82-84, p. 765-770 6 p.

Research output: Conference article

1 Citation (Scopus)
2000
23 Citations (Scopus)

In situ spectroscopic ellipsometry for the characterization of polysilicon formation inside a vertical furnace

Petrik, P., Lehnert, W., Schneider, C., Fried, M., Lohner, T., Gyulai, J. & Ryssel, H., márc. 27 2000, In : Thin Solid Films. 364, 1, p. 150-155 6 p.

Research output: Conference article

4 Citations (Scopus)

Non-destructive optical depth profiling and real-time evaluation of spectroscopic data

Fried, M. & Rédei, L., márc. 27 2000, In : Thin Solid Films. 364, 1, p. 64-74 11 p.

Research output: Conference article

8 Citations (Scopus)

Pore propagation directions in P+ porous silicon

Vázsonyi, É., Battistig, G., Horváth, Z. E., Fried, M., Kádár, G., Pászti, F., Cantin, J. L., Vanhaeren, D., Stalmans, L. & Poortmans, J., jan. 1 2000, In : Journal of Porous Materials. 7, 1, p. 57-61 5 p.

Research output: Conference article

3 Citations (Scopus)
1998
6 Citations (Scopus)
1 Citation (Scopus)
1995
2 Citations (Scopus)
1994
9 Citations (Scopus)