• 2836 Citations
  • 25 h-Index
1957 …2015

Research output per year

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Research Output

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Article
2013
2010

In situ spectroscopic ellipsometry study of protein immobilization on different substrates using liquid cells

Nemeth, A., Kozma, P., Hülber, T., Kurunczi, S., Horvath, R., Petrik, P., Muskotál, A., Vonderviszt, F., Hõs, C., Fried, M., Gyulai, J. & Bársony, I., okt. 1 2010, In : Sensor Letters. 8, 5, p. 730-735 6 p.

Research output: Article

11 Citations (Scopus)
2008

The role of defects in chemical sensing properties of carbon nanotube films

Horváth, Z. E., Koós, A. A., Kertész, K., Molnár, G., Vértesy, G., Bein, M. C., Frigyes, T., Mészáros, Z., Gyulai, J. & Biró, L. P., nov. 1 2008, In : Applied Physics A: Materials Science and Processing. 93, 2, p. 495-504 10 p.

Research output: Article

21 Citations (Scopus)
2007
17 Citations (Scopus)

Focused ion beam based sputtering yield measurements on ZnO and Mo thin films

Horváth, E., Németh, A., Koós, A. A., Bein, M. C., Tóth, A. L., Horváth, Z. E., Biró, L. P. & Gyulai, J., júl. 1 2007, In : Superlattices and Microstructures. 42, 1-6, p. 392-397 6 p.

Research output: Article

6 Citations (Scopus)
8 Citations (Scopus)
2006

Compositional analysis of HfxSiyO1-x-y thin films by medium energy ion scattering (MEIS) analysis

Kitano, H., Abo, S., Mizutani, M., Tsuchimoto, J., Lohner, T., Gyulai, J., Wakaya, F. & Takai, M., aug. 1 2006, In : Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 249, 1-2 SPEC. ISS., p. 246-249 4 p.

Research output: Article

4 Citations (Scopus)

Dielectric function of disorder in high-fluence helium-implanted silicon

Petrik, P., Fried, M., Lohner, T., Khánh, N. Q., Basa, P., Polgár, O., Major, C., Gyulai, J., Cayrel, F. & Alquier, D., dec. 1 2006, In : Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 253, 1-2, p. 192-195 4 p.

Research output: Article

7 Citations (Scopus)

Ellipsometric characterization of nanocrystals in porous silicon

Petrik, P., Fried, M., Vázsonyi, É., Lohner, T., Horváth, E., Polgár, O., Basa, P., Bársony, I. & Gyulai, J., okt. 31 2006, In : Applied Surface Science. 253, 1 SPEC. ISS., p. 200-203 4 p.

Research output: Article

14 Citations (Scopus)

Nanoscale morphology and photoemission of arsenic implanted germanium films

Petö, G., Khanh, N. Q., Horváth, Z. E., Molnár, G., Gyulai, J., Kótai, E., Guczi, L. & Frey, L., máj. 29 2006, In : Journal of Applied Physics. 99, 8, 084304.

Research output: Article

2 Citations (Scopus)
8 Citations (Scopus)
2005
65 Citations (Scopus)

Formation of epitaxial erbium-silicide islands on Si(0 0 1)

Peto, G., Molnár, G., Horváth, Z. E., Daróczi, C. S., Zsoldos, É. & Gyulai, J., márc. 10 2005, In : Surface Science. 578, 1-3, p. 142-148 7 p.

Research output: Article

10 Citations (Scopus)
7 Citations (Scopus)
5 Citations (Scopus)
2004

Carbon nanoarchitectures containing non-hexagonal rings: "Necklaces of pearls"

Biró, L. P., Márk, G. I., Horváth, Z. E., Kertész, K., Gyulai, J., Nagy, J. B. & Lambin, P., aug. 23 2004, In : Carbon. 42, 12-13, p. 2561-2566 6 p.

Research output: Article

21 Citations (Scopus)
2003
1 Citation (Scopus)

Continuous carbon nanotube production in underwater AC electric arc

Biró, L. P., Horváth, Z. E., Szalmás, L., Kertész, K., Wéber, F., Juhász, G., Radnóczi, G. & Gyulai, J., ápr. 29 2003, In : Chemical Physics Letters. 372, 3-4, p. 399-402 4 p.

Research output: Article

68 Citations (Scopus)
5 Citations (Scopus)

Ellipsometric characterization of damage profiles using an advanced optical model

Petrik, P., Polgár, O., Fried, M., Lohner, T., Khánh, N. Q. & Gyulai, J., febr. 15 2003, In : Journal of Applied Physics. 93, 4, p. 1987-1990 4 p.

Research output: Article

26 Citations (Scopus)
17 Citations (Scopus)

STM observation of asymmetrical Y-branched carbon nanotubes and nano-knees produced by the arc discharge method

Osváth, Z., Koós, A. A., Horváth, Z. E., Gyulai, J., Benito, A. M., Martínez, M. T., Maser, W. & Biró, L. P., jún. 10 2003, In : Materials Science and Engineering C. 23, 4, p. 561-564 4 p.

Research output: Article

11 Citations (Scopus)
2002

Arc-grown Y-branched carbon nanotubes observed by scanning tunneling microscopy (STM)

Osváth, Z., Koós, A. A., Horváth, Z. E., Gyulai, J., Benito, A. M., Martínez, M. T., Maser, W. K. & Biro, L. P., okt. 15 2002, In : Chemical Physics Letters. 365, 3-4, p. 338-342 5 p.

Research output: Article

21 Citations (Scopus)

Calculation of the charge spreading along a carbon nanotube seen in scanning tunnelling microscopy (STM)

Márk, G. I., Koós, A., Osváth, Z., Biró, L. P., Gyulai, J., Benito, A. M., Maser, W. K., Thiry, P. A. & Lambin, P., márc. 1 2002, In : Diamond and Related Materials. 11, 3-6, p. 961-963 3 p.

Research output: Article

2 Citations (Scopus)

Catalyst traces and other impurities in chemically purified carbon nanotubes grown by CVD

Biró, L. P., Khanh, N. Q., Vértesy, Z., Horváth, Z. E., Osváth, Z., Koós, A., Gyulai, J., Kocsonya, A., Kónya, Z., Zhang, X. B., Van Tendeloo, G., Fonseca, A. & Nagy, J. B., jan. 2 2002, In : Materials Science and Engineering C. 19, 1-2, p. 9-13 5 p.

Research output: Article

41 Citations (Scopus)
9 Citations (Scopus)
10 Citations (Scopus)

From straight carbon nanotubes to Y-branched and coiled carbon nanotubes

Biró, L. P., Ehlich, R., Osváth, Z., Koós, A., Horváth, Z. E., Gyulai, J. & Nagy, J. B., márc. 1 2002, In : Diamond and Related Materials. 11, 3-6, p. 1081-1085 5 p.

Research output: Article

31 Citations (Scopus)

Investigation of ion implantation-induced damage in the carbon and silicon sublattices of 6H-SiC

Zolnai, Z., Khánh, N. Q., Szilágyi, E., Kótai, E., Ster, A., Posselt, M., Lohner, T. & Gyulai, J., márc. 1 2002, In : Diamond and Related Materials. 11, 3-6, p. 1239-1242 4 p.

Research output: Article

9 Citations (Scopus)

Non-destructive characterization of strontium bismuth tantalate films

Petrik, P., Khánh, N. Q., Horváth, Z. E., Zolnai, Z., Bársony, I., Lohner, T., Fried, M., Gyulai, J., Schmidt, C., Schneider, C. & Ryssel, H., ápr. 1 2002, In : Materials Science in Semiconductor Processing. 5, 2-3, p. 141-145 5 p.

Research output: Article

1 Citation (Scopus)
34 Citations (Scopus)
2001
5 Citations (Scopus)

In situ measurement of the crystallization of amorphous silicon in a vertical furnace using spectroscopic ellipsometry

Petrik, P., Lehnert, W., Schneider, C., Lohner, T., Fried, M., Gyulai, J. & Ryssel, H., febr. 15 2001, In : Thin Solid Films. 383, 1-2, p. 235-240 6 p.

Research output: Article

5 Citations (Scopus)

SCTS: Scanning capacitance transient spectroscopy

Tóth, A. L., Dózsa, L., Gyulai, J., Giannazzo, F. & Raineri, V., febr. 6 2001, In : Materials Science in Semiconductor Processing. 4, 1-3, p. 89-91 3 p.

Research output: Article

13 Citations (Scopus)
2000

Ellipsometric study of polycrystalline silicon films prepared by low-pressure chemical vapor deposition

Petrik, P., Lohner, T., Fried, M., Biró, L. P., Khánh, N. Q., Gyulai, J., Lehnert, W., Schneider, C. & Ryssel, H., febr. 2000, In : Journal of Applied Physics. 87, 4, p. 1734-1742 9 p.

Research output: Article

54 Citations (Scopus)

Selective nucleation and growth of carbon nanotubes at the CoSi2/Si interface

Biró, L. P., Molnár, G., Szabó, I., Vértesy, Z., Horváth, Z. E., Gyulai, J., Kónya, Z., Piedigrosso, P., Fonseca, A., Nagy, J. B. & Thiry, P. A., febr. 7 2000, In : Applied Physics Letters. 76, 6, p. 706-708 3 p.

Research output: Article

9 Citations (Scopus)

Simulation of scanning tunneling spectroscopy of supported carbon nanotubes

Márk, G. I., Biró, L. P., Gyulai, J., Thiry, P. A., Lucas, A. A. & Lambin, P., jan. 1 2000, In : Physical Review B - Condensed Matter and Materials Physics. 62, 4, p. 2797-2805 9 p.

Research output: Article

19 Citations (Scopus)

Y-branching of single walled carbon nanotubes

Nagy, P., Ehlich, R., Biró, L. P. & Gyulai, J., ápr. 1 2000, In : Applied Physics A: Materials Science and Processing. 70, 4, p. 481-483 3 p.

Research output: Article

78 Citations (Scopus)
1999
17 Citations (Scopus)
11 Citations (Scopus)
14 Citations (Scopus)

Defects caused by high-energy ion beams, as measured by scanning probe methods

Biró, L. P., Gyulai, J., Márk, G. I. & Daróczi, C. S., jún. 1 1999, In : Micron. 30, 3, p. 245-254 10 p.

Research output: Article

4 Citations (Scopus)
18 Citations (Scopus)
5 Citations (Scopus)
1998
38 Citations (Scopus)
79 Citations (Scopus)