• 1476 Citations
  • 18 h-Index
1989 …2020

Research output per year

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Research Output

  • 1476 Citations
  • 18 h-Index
  • 82 Article
  • 12 Conference article
  • 5 Conference contribution
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Conference contribution
2017

Design, Ion beam fabrication and test of integrated optical elements

Bányász, I., Pelli, S., Nunzi-Conti, G., Righini, G. C., Berneschi, S., Szilágyi, E., Németh, A., Fried, M., Petrik, P., Agócs, E., Kalas, B., Zolnai, Z., Khanh, N. Q., Rajta, I., Nagy, G. U. L., Havranek, V., Vosecek, V., Veres, M. & Himics, L., 2017, PHOTOPTICS 2018 - Proceedings of the 6th International Conference on Photonics, Optics and Laser Technology. Raposo, M. & Ribeiro, P. A. (eds.). SciTePress, p. 279-285 7 p. (PHOTOPTICS 2018 - Proceedings of the 6th International Conference on Photonics, Optics and Laser Technology; vol. 2017-January).

Research output: Conference contribution

Open Access
2016

The use of ion beam techniques for the fabrication of integrated optical elements

Banyasz, I., Berneschi, S., Fried, M., Havranek, V., Khanh, N. Q., Nagy, G. U. L., Nemeth, A., Nunzi-Conti, G., Pelli, S., Rajta, I., Righini, C., Szilágyi, E., Veres, M. & Zolnai, Z., aug. 23 2016, 2016 18th International Conference on Transparent Optical Networks, ICTON 2016. IEEE Computer Society, Vol. 2016-August. 7550712

Research output: Conference contribution

2011

Probing of Ag-based resistive switching on the nanoscale

Geresdi, A., Halbritter, A., Szilágyi, E. & Mihály, G., dec. 1 2011, Frontier of Solid-State Ionics. p. 38-43 6 p. (Materials Research Society Symposium Proceedings; vol. 1331).

Research output: Conference contribution

2 Citations (Scopus)
2003

High-Sensitivity Ion Beam Analytical Method for Studying Ion-Implanted SiC

Battistig, G., Garcia Lopez, J., Khanh, N. Q., Morilla, Y., Respaldiza, M. A. & Szilágyi, E., jan. 1 2003, Materials Science Forum. Bergman, P. & Janzén, E. (eds.). Trans Tech Publications Ltd, p. 625-628 4 p. (Materials Science Forum; vol. 433-436).

Research output: Conference contribution

4 Citations (Scopus)
2000

Ion implantation induced damage in silicon carbide studied by Non-Rutherford elastic backscattering

Szilágyi, E., Kótai, E., Khánh, N. Q., Zolnai, Z., Battistig, G., Lohner, T. & Gyulai, J., dec. 1 2000, 2000 International Conference on Ion Implantation Technology, IIT 2000 - Proceedings. p. 131-134 4 p. 924108. (Proceedings of the International Conference on Ion Implantation Technology).

Research output: Conference contribution

4 Citations (Scopus)