XRD and XPS analysis of laser treated vanadium oxide thin films

S. Beke, L. Kõrösi, S. Papp, A. Oszkó, L. Nánai

Research output: Contribution to journalArticle

30 Citations (Scopus)

Abstract

In this work, we present X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) analysis of laser treated vanadium oxide sols. The films were also observed by transmission electron microscopy (TEM) and scanning electron microscopy (SEM) to reveal how the original xerogel structure changes into irregular shaped, layer structured V2O5 due to the laser radiation. XRD revealed that above 102 W/cm2 the original xerogel structure disappears and above 129 W/cm2 the films become totally polycrystalline with an orthorhombic structure. XPS spectra showed O/V ratio increment by using higher laser intensities.

Original languageEnglish
Pages (from-to)9779-9782
Number of pages4
JournalApplied Surface Science
Volume255
Issue number24
DOIs
Publication statusPublished - Sep 30 2009

Fingerprint

Vanadium
Xerogels
Oxide films
X ray photoelectron spectroscopy
X ray diffraction
Thin films
Lasers
Polymethyl Methacrylate
Laser radiation
Sols
Oxides
X ray diffraction analysis
Transmission electron microscopy
Scanning electron microscopy
vanadium pentoxide

Keywords

  • Laser radiation
  • Sol-gel process
  • Vanadium oxide thin films
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

Cite this

XRD and XPS analysis of laser treated vanadium oxide thin films. / Beke, S.; Kõrösi, L.; Papp, S.; Oszkó, A.; Nánai, L.

In: Applied Surface Science, Vol. 255, No. 24, 30.09.2009, p. 9779-9782.

Research output: Contribution to journalArticle

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