XPS STUDY OF ION-INDUCED CHANGES ON THE SURFACE OF AN ORGANOSILICON MODEL POLYMER.

Research output: Contribution to journalArticle

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Abstract

Changes in composition and bonding induced by bombardment with argon or nitrogen ions in a commercial poly-methyl-phenyl-cyanopropyl-siloxane fluid were examined by XPS. The actual surface composition depended on the ion energy, the etch time and the nature of the gas applied. It was found that phenyl groups were damaged seriously, reaction of the cyano groups took place with the formation of minus C equals N minus type bonds and the polymer degraded with elimination of fragments containing mostly C at the first stage and mainly O and Si at advanced stages. In addition nitrogen was found to build into the polymer surface when bombarding by nitrogen ions. Irreversible changes in the spectra of the fluid polymer were regarded as a sign of crosslinking.

Original languageEnglish
Pages (from-to)282-288
Number of pages7
JournalSurface and Interface Analysis
Volume7
Issue number6
Publication statusPublished - Dec 1985

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Polymers
Nitrogen
X ray photoelectron spectroscopy
nitrogen ions
Ions
polymers
Siloxanes
ions
Fluids
Argon
fluids
siloxanes
crosslinking
Surface structure
Crosslinking
bombardment
elimination
Gases
argon
fragments

ASJC Scopus subject areas

  • Colloid and Surface Chemistry
  • Physical and Theoretical Chemistry

Cite this

XPS STUDY OF ION-INDUCED CHANGES ON THE SURFACE OF AN ORGANOSILICON MODEL POLYMER. / Tóth, A.; Bertóti, I.; Szekely, T.; Mohai, M.

In: Surface and Interface Analysis, Vol. 7, No. 6, 12.1985, p. 282-288.

Research output: Contribution to journalArticle

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