XPS characterization of ultrafine Si3N4 powders

I. Bertóti, G. Varsanyi, G. Mink, T. Szekely, J. Vaivads, T. Millers, J. Grabis

Research output: Contribution to journalArticle

47 Citations (Scopus)

Abstract

The mechanical properties of Si3N4 based ceramic bodies are largely controlled by the phases formed on the grain boundaries during sintering. For this reason determination of the state and the chemical composition of the surface of the starting Si3N4 powder is of prime theoretical and practical importance, especially in the cases when advanced ultrafine powders are used. In this work an ultrafine Si3N4 powder, obtained by high temperature plasma nitridation of silicon, has been characterized by XPS. Oxygen, carbon and also a small amount of potassium were detected as surface impurities. The Si 2p and Si (KLL) spectral lines could be decomposed into two components corresponding to silicon in Si3 N4 and SiO2 phases. From angle-resolved and Ar-ion depth-profiling experiments a layer model, consisting of a Si3 N4 core covered by a relatively thick SiO2 layer and a carbon contaminant overlayer, could be elucidated.

Original languageEnglish
Pages (from-to)527-530
Number of pages4
JournalSurface and Interface Analysis
Volume12
Issue number1-12
Publication statusPublished - Jul 1988

Fingerprint

Powders
X ray photoelectron spectroscopy
Silicon
Carbon
Impurities
Nitridation
Depth profiling
carbon
silicon
high temperature plasmas
contaminants
line spectra
Potassium
potassium
sintering
chemical composition
Grain boundaries
Sintering
grain boundaries
mechanical properties

ASJC Scopus subject areas

  • Colloid and Surface Chemistry
  • Physical and Theoretical Chemistry

Cite this

Bertóti, I., Varsanyi, G., Mink, G., Szekely, T., Vaivads, J., Millers, T., & Grabis, J. (1988). XPS characterization of ultrafine Si3N4 powders. Surface and Interface Analysis, 12(1-12), 527-530.

XPS characterization of ultrafine Si3N4 powders. / Bertóti, I.; Varsanyi, G.; Mink, G.; Szekely, T.; Vaivads, J.; Millers, T.; Grabis, J.

In: Surface and Interface Analysis, Vol. 12, No. 1-12, 07.1988, p. 527-530.

Research output: Contribution to journalArticle

Bertóti, I, Varsanyi, G, Mink, G, Szekely, T, Vaivads, J, Millers, T & Grabis, J 1988, 'XPS characterization of ultrafine Si3N4 powders', Surface and Interface Analysis, vol. 12, no. 1-12, pp. 527-530.
Bertóti I, Varsanyi G, Mink G, Szekely T, Vaivads J, Millers T et al. XPS characterization of ultrafine Si3N4 powders. Surface and Interface Analysis. 1988 Jul;12(1-12):527-530.
Bertóti, I. ; Varsanyi, G. ; Mink, G. ; Szekely, T. ; Vaivads, J. ; Millers, T. ; Grabis, J. / XPS characterization of ultrafine Si3N4 powders. In: Surface and Interface Analysis. 1988 ; Vol. 12, No. 1-12. pp. 527-530.
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