X-ray Raman scattering at the L edges of elemental Na, Si, and the N edge of Ba in Ba8Si46

C. Sternemann, J. A. Soininen, S. Huotari, G. Vankó, M. Volmer, R. A. Secco, J. S. Tse, M. Tolan

Research output: Contribution to journalArticle

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Abstract

X-ray Raman spectra of the Na and Si LII,III edges have been measured for different momentum transfers at beamline ID16 of European Synchrotron Radiation Facility using the inelastic x-ray-scattering setup with an energy resolution of about 1eV. The momentum transfer dependence of these spectra is analyzed using a first-principles method that takes into account the particle-hole interaction as well as the final states self-energy effects. As an example for application of x-ray Raman scattering to higher Z elements the Ba N edge of a sample of Ba-doped Si clathrate Ba8Si46 is presented. The potential of x-ray Raman scattering to measure L, M, and N edges is emphasized and discussed along with the future perspectives of different theoretical approaches.

Original languageEnglish
Article number035104
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume72
Issue number3
DOIs
Publication statusPublished - Jul 15 2005

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x ray scattering
X ray scattering
Raman scattering
Raman spectra
X rays
momentum transfer
Momentum transfer
x rays
clathrates
synchrotron radiation
inelastic scattering
Synchrotron radiation
energy
Scattering
interactions

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

X-ray Raman scattering at the L edges of elemental Na, Si, and the N edge of Ba in Ba8Si46. / Sternemann, C.; Soininen, J. A.; Huotari, S.; Vankó, G.; Volmer, M.; Secco, R. A.; Tse, J. S.; Tolan, M.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 72, No. 3, 035104, 15.07.2005.

Research output: Contribution to journalArticle

Sternemann, C. ; Soininen, J. A. ; Huotari, S. ; Vankó, G. ; Volmer, M. ; Secco, R. A. ; Tse, J. S. ; Tolan, M. / X-ray Raman scattering at the L edges of elemental Na, Si, and the N edge of Ba in Ba8Si46. In: Physical Review B - Condensed Matter and Materials Physics. 2005 ; Vol. 72, No. 3.
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AU - Volmer, M.

AU - Secco, R. A.

AU - Tse, J. S.

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