X-ray photoelectron spectroscopy studies on solid xanthates

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Two commonly used xanthates, potassium ethyl xanthate (KEX) and sodium isopropyl xanthate (NaiPX) were characterized by comparing their bulk and surface composition. The XPS spectra were recorded using Al Kα and Mg Kα excitation and potential sources of contamination were accounted for. Sulfate and carbonate contaminations were identified, both in the bulk and on the surface of the KEX sample. NaiPX contained hydroxyl- and carbonyl-type contaminations. The earlier published XPS spectral data on xanthates were compiled and compared with the results of this work.

Original languageEnglish
Pages (from-to)239-250
Number of pages12
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume50
Issue number2
DOIs
Publication statusPublished - 1990

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contamination
Contamination
X ray photoelectron spectroscopy
photoelectron spectroscopy
x rays
Carbonates
Surface structure
Hydroxyl Radical
Sulfates
Potassium
sulfates
carbonates
potassium
Sodium
sodium
excitation

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Spectroscopy
  • Atomic and Molecular Physics, and Optics
  • Surfaces and Interfaces

Cite this

X-ray photoelectron spectroscopy studies on solid xanthates. / Szépvölgyi, J.; Tüdös, Anna; Bertóti, I.

In: Journal of Electron Spectroscopy and Related Phenomena, Vol. 50, No. 2, 1990, p. 239-250.

Research output: Contribution to journalArticle

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