X-ray line profile analysis of Nanodisperse silicon nitride ceramics

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2 Citations (Scopus)


Nanodisperse silicon nitride powders were produced by different methods of synthesis. The effect of the production routes on the grain-size distribution and the dislocation density in the powders were studied by high-resolution X-ray diffraction. The average grain-size and the dislocation density of the samples were determined by the recently developed modified Williamson-Hall and Warren-Averbach procedures from X-ray diffraction profiles. A new numerical method provided log-normal grain-size distributions from the size parameters derived from X-ray diffraction profiles. It was established that the powder produced by silicon nitridation and milling had lower average grain-size and wider size distribution than the sample crystallized from amorphous silicon nitride powder synthesized in plasma reactor. The grain-size distribution and the area-weighted average grain-size obtained by X-rays were in good agreement with those determined by TEM and from the specific surface area, respectively. The dislocation density was found to be between 1014 and 1015m-2.

Original languageEnglish
Pages (from-to)729-734
Number of pages6
JournalMaterials Science Forum
Issue numberII
Publication statusPublished - Jan 1 2001
Event7th European Powder Diffraction Conference - Barcelona, Spain
Duration: May 20 2000May 23 2000


  • Grain size distribution
  • Nanodisperse silicon nitride
  • X-ray diffraction profile analysis

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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