X-ray line profile analysis in materials science

Research output: Book/ReportBook

46 Citations (Scopus)

Abstract

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

Original languageEnglish
PublisherIGI Global
Number of pages343
ISBN (Electronic)9781466658530
ISBN (Print)1466658525, 9781466658523
DOIs
Publication statusPublished - Mar 31 2014

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ASJC Scopus subject areas

  • Engineering(all)
  • Materials Science(all)
  • Physics and Astronomy(all)
  • Chemical Engineering(all)

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