X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials

Michael B. Kerber, Michael J. Zehetbauer, Erhard Schafler, Florian C. Spieckermann, Sigrid Bernstorff, T. Ungár

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

For a long time the shift and broadening of Bragg profiles have been used to evaluate internal stresses and coherent domain sizes, i.e. the smallest crystalline region without lattice defects. Modern technology provides both enhanced detector resolution and high brilliance x-ray sources thus allowing measurements of x-ray peaks with a high resolution in space and time. In parallel to the hardware, also diffraction theories have been substantially improved so that the shape of Bragg profiles can be quantitatively evaluated not only in terms of the crystallite size and its distribution, but also in terms of the density, type and arrangement of dislocations, twins and stacking faults. Thus state-of-the-art x-ray line profile analysis enables the thorough characterization especially of nanostructured materials which also contain lattice defects. The method can be used also to prove the existence of dislocations in crystalline materials. Examples of nanostructured metals, polymers and even molecular crystals like fullerenes are given.

Original languageEnglish
JournalJOM
Volume63
Issue number7
DOIs
Publication statusPublished - Jul 2011

Fingerprint

Nanostructured materials
Crystal defects
Dislocations (crystals)
X rays
Crystalline materials
Fullerenes
Molecular crystals
Stacking faults
Crystallite size
Residual stresses
Polymers
Diffraction
Metals
Detectors
Hardware

ASJC Scopus subject areas

  • Engineering(all)
  • Materials Science(all)

Cite this

Kerber, M. B., Zehetbauer, M. J., Schafler, E., Spieckermann, F. C., Bernstorff, S., & Ungár, T. (2011). X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials. JOM, 63(7). https://doi.org/10.1007/s11837-011-0115-1

X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials. / Kerber, Michael B.; Zehetbauer, Michael J.; Schafler, Erhard; Spieckermann, Florian C.; Bernstorff, Sigrid; Ungár, T.

In: JOM, Vol. 63, No. 7, 07.2011.

Research output: Contribution to journalArticle

Kerber, MB, Zehetbauer, MJ, Schafler, E, Spieckermann, FC, Bernstorff, S & Ungár, T 2011, 'X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials', JOM, vol. 63, no. 7. https://doi.org/10.1007/s11837-011-0115-1
Kerber, Michael B. ; Zehetbauer, Michael J. ; Schafler, Erhard ; Spieckermann, Florian C. ; Bernstorff, Sigrid ; Ungár, T. / X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials. In: JOM. 2011 ; Vol. 63, No. 7.
@article{4d4041bdda0240acbd40940ef0b4ce29,
title = "X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials",
abstract = "For a long time the shift and broadening of Bragg profiles have been used to evaluate internal stresses and coherent domain sizes, i.e. the smallest crystalline region without lattice defects. Modern technology provides both enhanced detector resolution and high brilliance x-ray sources thus allowing measurements of x-ray peaks with a high resolution in space and time. In parallel to the hardware, also diffraction theories have been substantially improved so that the shape of Bragg profiles can be quantitatively evaluated not only in terms of the crystallite size and its distribution, but also in terms of the density, type and arrangement of dislocations, twins and stacking faults. Thus state-of-the-art x-ray line profile analysis enables the thorough characterization especially of nanostructured materials which also contain lattice defects. The method can be used also to prove the existence of dislocations in crystalline materials. Examples of nanostructured metals, polymers and even molecular crystals like fullerenes are given.",
author = "Kerber, {Michael B.} and Zehetbauer, {Michael J.} and Erhard Schafler and Spieckermann, {Florian C.} and Sigrid Bernstorff and T. Ung{\'a}r",
year = "2011",
month = "7",
doi = "10.1007/s11837-011-0115-1",
language = "English",
volume = "63",
journal = "JOM",
issn = "1047-4838",
publisher = "Minerals, Metals and Materials Society",
number = "7",

}

TY - JOUR

T1 - X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials

AU - Kerber, Michael B.

AU - Zehetbauer, Michael J.

AU - Schafler, Erhard

AU - Spieckermann, Florian C.

AU - Bernstorff, Sigrid

AU - Ungár, T.

PY - 2011/7

Y1 - 2011/7

N2 - For a long time the shift and broadening of Bragg profiles have been used to evaluate internal stresses and coherent domain sizes, i.e. the smallest crystalline region without lattice defects. Modern technology provides both enhanced detector resolution and high brilliance x-ray sources thus allowing measurements of x-ray peaks with a high resolution in space and time. In parallel to the hardware, also diffraction theories have been substantially improved so that the shape of Bragg profiles can be quantitatively evaluated not only in terms of the crystallite size and its distribution, but also in terms of the density, type and arrangement of dislocations, twins and stacking faults. Thus state-of-the-art x-ray line profile analysis enables the thorough characterization especially of nanostructured materials which also contain lattice defects. The method can be used also to prove the existence of dislocations in crystalline materials. Examples of nanostructured metals, polymers and even molecular crystals like fullerenes are given.

AB - For a long time the shift and broadening of Bragg profiles have been used to evaluate internal stresses and coherent domain sizes, i.e. the smallest crystalline region without lattice defects. Modern technology provides both enhanced detector resolution and high brilliance x-ray sources thus allowing measurements of x-ray peaks with a high resolution in space and time. In parallel to the hardware, also diffraction theories have been substantially improved so that the shape of Bragg profiles can be quantitatively evaluated not only in terms of the crystallite size and its distribution, but also in terms of the density, type and arrangement of dislocations, twins and stacking faults. Thus state-of-the-art x-ray line profile analysis enables the thorough characterization especially of nanostructured materials which also contain lattice defects. The method can be used also to prove the existence of dislocations in crystalline materials. Examples of nanostructured metals, polymers and even molecular crystals like fullerenes are given.

UR - http://www.scopus.com/inward/record.url?scp=80051527747&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80051527747&partnerID=8YFLogxK

U2 - 10.1007/s11837-011-0115-1

DO - 10.1007/s11837-011-0115-1

M3 - Article

AN - SCOPUS:80051527747

VL - 63

JO - JOM

JF - JOM

SN - 1047-4838

IS - 7

ER -