X-ray fluorescence holography

G. Faigel, M. Tegze, S. Marchesini, M. Belakhovsky

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

In the last decade, hard X-ray holography using an inside reference point has been developed for the study of 3D atomic arrangements in solids. Two types of this method are used: `normal holography' in which the atoms serve as sources of X-radiation and `inverse holography' in which the atoms detect the interference field originating from the incident and scattered waves. Beside the first two demonstration experiments, there have not been many measurements of this type. The cause of this is that there are serious technical difficulties and evaluation problems, which have to be solved before there can be wider application. Lately, many of these problems have been overcome; so hard X-ray holography became a useful tool for structural studies. Recent developments in the field are discussed and the capabilities of the method are illustrated by examples.

Original languageEnglish
Pages (from-to)1063-1068
Number of pages6
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume114-116
DOIs
Publication statusPublished - Mar 2001

Fingerprint

Holography
holography
Fluorescence
X rays
fluorescence
x rays
Atoms
atoms
Demonstrations
interference
Radiation
evaluation
causes
radiation
Experiments

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Spectroscopy
  • Atomic and Molecular Physics, and Optics
  • Surfaces and Interfaces

Cite this

X-ray fluorescence holography. / Faigel, G.; Tegze, M.; Marchesini, S.; Belakhovsky, M.

In: Journal of Electron Spectroscopy and Related Phenomena, Vol. 114-116, 03.2001, p. 1063-1068.

Research output: Contribution to journalArticle

Faigel, G. ; Tegze, M. ; Marchesini, S. ; Belakhovsky, M. / X-ray fluorescence holography. In: Journal of Electron Spectroscopy and Related Phenomena. 2001 ; Vol. 114-116. pp. 1063-1068.
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