X-ray emission for 3-137 keV Ar17+ impacting SiO2

E. Takács, Z. Ónodi-Szucs, L. P. Ratliff, J. D. Gillaspy, J. Pálinkás

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5 Citations (Scopus)


We report X-ray spectra from Ar17+ impacting a SiO2 surface at 30° from normal incidence, for projectile energies ranging from 3 to 137 keV. At the highest energy we see only X-rays from the filling of the argon K shell. As the projectile energy is reduced, these argon X-rays are gradually reduced to zero while a silicon Kα peak appears. We interpret these data to be the result of the onset of a direct transfer of a silicon K-shell electron to the K-shell vacancy in the argon projectile. We suggest that this transfer occurs through an argon-silicon Auger process which takes place during a close collision in the solid. The velocity dependence of this process is not yet fully understood.

Original languageEnglish
Pages (from-to)431-434
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Issue number2-3
Publication statusPublished - Apr 1997

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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