X-ray diffraction and Raman scattering in SbSI nanocrystals

A. V. Gomonnai, I. M. Voynarovych, A. M. Solomon, Yu M. Azhniuk, S. Kökényesi, V. P. Pinzenik, M. Kis-Varga, L. Daróczi, V. V. Lopushansky

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Lattice structure and rod-like shaped SbSI nanocrystals obtained by ball milling with rod thickness down to 70nm, as estimated from X-ray diffraction (XRD) and electron microscopy, is similar to that of the bulk crystals. The dependence of the grain size on the milling duration is discussed in view of the chain-like crystalline structure of SbSI. Possible factors, responsible for the observed Raman line broadening, are discussed, scattering by surface phonons being considered the predominant one.

Original languageEnglish
Pages (from-to)1767-1772
Number of pages6
JournalMaterials Research Bulletin
Volume38
Issue number13
DOIs
Publication statusPublished - Oct 30 2003

Fingerprint

Ball milling
Phonons
Crystal lattices
Nanocrystals
Electron microscopy
Raman scattering
nanocrystals
rods
Scattering
Raman spectra
Crystalline materials
X ray diffraction
Crystals
scattering
diffraction
balls
electron microscopy
phonons
x rays
grain size

Keywords

  • A. Inorganic compounds
  • A. Nanostructures
  • C. Raman spectroscopy
  • C. X-ray diffraction

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

Cite this

Gomonnai, A. V., Voynarovych, I. M., Solomon, A. M., Azhniuk, Y. M., Kökényesi, S., Pinzenik, V. P., ... Lopushansky, V. V. (2003). X-ray diffraction and Raman scattering in SbSI nanocrystals. Materials Research Bulletin, 38(13), 1767-1772. https://doi.org/10.1016/S0025-5408(03)00181-8

X-ray diffraction and Raman scattering in SbSI nanocrystals. / Gomonnai, A. V.; Voynarovych, I. M.; Solomon, A. M.; Azhniuk, Yu M.; Kökényesi, S.; Pinzenik, V. P.; Kis-Varga, M.; Daróczi, L.; Lopushansky, V. V.

In: Materials Research Bulletin, Vol. 38, No. 13, 30.10.2003, p. 1767-1772.

Research output: Contribution to journalArticle

Gomonnai, AV, Voynarovych, IM, Solomon, AM, Azhniuk, YM, Kökényesi, S, Pinzenik, VP, Kis-Varga, M, Daróczi, L & Lopushansky, VV 2003, 'X-ray diffraction and Raman scattering in SbSI nanocrystals', Materials Research Bulletin, vol. 38, no. 13, pp. 1767-1772. https://doi.org/10.1016/S0025-5408(03)00181-8
Gomonnai AV, Voynarovych IM, Solomon AM, Azhniuk YM, Kökényesi S, Pinzenik VP et al. X-ray diffraction and Raman scattering in SbSI nanocrystals. Materials Research Bulletin. 2003 Oct 30;38(13):1767-1772. https://doi.org/10.1016/S0025-5408(03)00181-8
Gomonnai, A. V. ; Voynarovych, I. M. ; Solomon, A. M. ; Azhniuk, Yu M. ; Kökényesi, S. ; Pinzenik, V. P. ; Kis-Varga, M. ; Daróczi, L. ; Lopushansky, V. V. / X-ray diffraction and Raman scattering in SbSI nanocrystals. In: Materials Research Bulletin. 2003 ; Vol. 38, No. 13. pp. 1767-1772.
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