Wavelength-dispersive double flat-crystal analyzer for inelastic X-ray scattering

G. Bortel, E. E. Alp, W. Sturhahn, T. S. Toellner

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A double flat-crystal analyzer for inelastic X-ray scattering is described. The general correlation between the energy and direction of the X-rays transmitted by the analyzer allows one to collect data for a range of energy transfers simultaneously. Such an analyzer with 120 meV resolution was built to operate at the copper K edge. Experimental results show that this X-ray optic can be an alternative to a conventional spherical-focusing backscattering analyzer in resonant inelastic X-ray scattering experiments or when flexible energy resolution or high momentum resolution is required.

Original languageEnglish
Pages (from-to)333-339
Number of pages7
JournalJournal of Synchrotron Radiation
Volume7
Issue number5
Publication statusPublished - Sep 1 2000

Fingerprint

Inelastic scattering
X ray scattering
analyzers
X ray optics
Wavelength
Crystals
Backscattering
scattering
wavelengths
Energy transfer
crystals
Momentum
x rays
Copper
X rays
geometrical optics
backscattering
Experiments
energy transfer
momentum

Keywords

  • Absorption edges
  • Crystal analyzers
  • Electronic and vibrational excitations
  • Parallel data collection
  • Resonant/anomalous inelastic X-ray scattering
  • X-ray optics

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Radiation

Cite this

Wavelength-dispersive double flat-crystal analyzer for inelastic X-ray scattering. / Bortel, G.; Alp, E. E.; Sturhahn, W.; Toellner, T. S.

In: Journal of Synchrotron Radiation, Vol. 7, No. 5, 01.09.2000, p. 333-339.

Research output: Contribution to journalArticle

Bortel, G. ; Alp, E. E. ; Sturhahn, W. ; Toellner, T. S. / Wavelength-dispersive double flat-crystal analyzer for inelastic X-ray scattering. In: Journal of Synchrotron Radiation. 2000 ; Vol. 7, No. 5. pp. 333-339.
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