Use of secondary-electron yields determined from breakdown data in cathode-fall models for Ar

A. V. Phelps, L. C. Pitchford, C. Pédoussat, Z. Donkó

Research output: Contribution to journalArticle

48 Citations (Scopus)

Abstract

We test the utility of recently published secondary-electron yields per ion for the prediction of operating voltages for abnormal cathode-fall discharges in Ar for normalized current densities ≤20 mA cm-2 Torr-2. The effective secondary-electron yields per ion derived from spatially-uniform field breakdown and low-current discharge data give much too small discharge voltages at the higher current densities. In contrast, published secondary-electron yields per ion derived from ion-beam data at high ion energies and breakdown data at low ion energies give abnormal cathode-fall voltages that are within the present uncertainty of the models and of experimental data for Cu cathodes.

Original languageEnglish
JournalPlasma Sources Science and Technology
Volume8
Issue number4
DOIs
Publication statusPublished - Nov 1999

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breakdown
cathodes
ions
electrons
electric potential
current density
low currents
high current
ion beams
energy
predictions

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Condensed Matter Physics

Cite this

Use of secondary-electron yields determined from breakdown data in cathode-fall models for Ar. / Phelps, A. V.; Pitchford, L. C.; Pédoussat, C.; Donkó, Z.

In: Plasma Sources Science and Technology, Vol. 8, No. 4, 11.1999.

Research output: Contribution to journalArticle

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