Upper bounding variations of best linear approximations of nonlinear systems in power sweep measurements

Johan Schoukens, T. Dobrowiecki, Yves Rolain, Rik Pintelon

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

In many engineering applications, linear models are preferred, even if it is known that the system is nonlinear. A large class of nonlinear systems can be represented as Y = GBLAU + YS, with GBLA being the best linear approximation and YS being a nonlinear noise source that represents that part of the output that is not captured by the linear approximation. Because GBLA not only depends upon the linear dynamics but also on the nonlinear distortions, it will vary if the input power is changed. In this paper, we study under what conditions (class of excitations and class of nonlinear systems) these variations of GBLA can be bounded, starting from the knowledge of the power spectrum SYS. In general, without a restriction of the class of systems, no upper bound can be given. However, for some important classes of systems, the variations can be bounded by selecting a well-defined criterion. Since SYS can easily be measured using well-designed measurement procedures, it becomes possible to provide the designer with an upper bound for the variations of GBLA leading to more robust design procedures.

Original languageEnglish
Article number5371987
Pages (from-to)1141-1148
Number of pages8
JournalIEEE Transactions on Instrumentation and Measurement
Volume59
Issue number5
DOIs
Publication statusPublished - May 2010

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nonlinear systems
Nonlinear systems
approximation
Nonlinear distortion
Power spectrum
power spectra
constrictions
engineering
output
excitation

Keywords

  • Linear approximation
  • Nonlinear bias
  • Nonlinear systems
  • Nonlinearvariance
  • Volterra

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Instrumentation

Cite this

Upper bounding variations of best linear approximations of nonlinear systems in power sweep measurements. / Schoukens, Johan; Dobrowiecki, T.; Rolain, Yves; Pintelon, Rik.

In: IEEE Transactions on Instrumentation and Measurement, Vol. 59, No. 5, 5371987, 05.2010, p. 1141-1148.

Research output: Contribution to journalArticle

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