Ultrasharp textures in Al/Ti layered structures

M. Adamik, P. Barna, I. Tomov

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The aim of the present work was to reveal the structure characteristics of Al/Ti layered structures. For this purpose, conventional (CTEM), high-resolution transmission electron microscopy (HRTEM) and standard X-ray diffractometer measurements have been applied. The layered Al films exhibit an ultrasharp 〈111〉 texture. The 〈111〉 pole density of the films increases linearly with increasing number of Al/Ti layer pairs. The Al layers contain grains oriented in the 〈111〉 crystalline direction only. The texture sharpness in the single Al films decreases with increasing thickness of the Ti underlayer.

Original languageEnglish
Pages (from-to)338-340
Number of pages3
JournalSurface and Coatings Technology
Volume100-101
Issue number1-3
Publication statusPublished - Mar 1998

Fingerprint

textures
Textures
sharpness
Diffractometers
High resolution transmission electron microscopy
diffractometers
Poles
poles
Crystalline materials
X rays
transmission electron microscopy
high resolution
x rays
Direction compound

Keywords

  • Aluminium
  • Layered structures
  • Textures
  • Titanium

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Ultrasharp textures in Al/Ti layered structures. / Adamik, M.; Barna, P.; Tomov, I.

In: Surface and Coatings Technology, Vol. 100-101, No. 1-3, 03.1998, p. 338-340.

Research output: Contribution to journalArticle

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