Ultrafast dynamics and carrier-envelope phase sensitivity of multiphoton photoemission from metal surfaces

P. Dombi, F. Krausz, G. Farkas

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Abstract

Subcycle dynamics of multiphoton-induced photoelectron emission from metal surfaces is analysed using a simple phenomenological model to assess optimum conditions for direct carrier-envelope phase measurement. To gain further insight femtosecond time-resolved measurements were carried out on a polycrystalline gold surface with ultrashort laser pulses to explain the recently found, unexpectedly low carrier-envelope phase dependence of the photoemission process in this particular case. In the higher-order interferometric autocorrelation distribution additional short side wings appeared suggesting that ultrafast dynamics of hot electrons reduce the carrier-envelope phase dependence of the photoemission electron yield produced by few-cycle laser pulses. Other metals can be investigated with this simple and fast method to pave the way towards the construction of a solid-state-based, direct carrier-envelope phase detector.

Original languageEnglish
Pages (from-to)163-172
Number of pages10
JournalJournal of Modern Optics
Volume53-1
Issue number2
DOIs
Publication statusPublished - Jan 10 2006

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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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