Two-In-one sample preparation for plan-VIew TEM

G. Sáfrán, Noémi Szász, Eszter Sáfrán

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Transmission electron microscopy (TEM) sample preparation requires special skills, it is time consuming and costly, hence, an increase of the efficiency is of primary importance. This article describes a method that duplicates the yield of the conventional mechanical and ion beam preparation of plan-view TEM samples. As a modification of the usual procedures, instead of one two different samples are comprised in a single specimen. The two pre-cut slabs, one from each samples, are embedded side by side in the window of a 3 mm dia Ti disk and the specimen is thinned mechanically and by ion milling until perforation that occurs at the interface of the two different slabs. That, with proper implementation, provides acceptable size thin area for the TEM study of both samples. The suitability of the two-in-one method has been confirmed through examples.

Original languageEnglish
Pages (from-to)599-602
Number of pages4
JournalMicroscopy Research and Technique
Volume78
Issue number7
DOIs
Publication statusPublished - Jul 1 2015

Fingerprint

Transmission Electron Microscopy
Transmission electron microscopy
preparation
transmission electron microscopy
Ions
slabs
Ion beams
perforation
ion beams
ions

Keywords

  • Different slabs
  • Embedding in Ti disk
  • Simultaneous thinning
  • Spare time and costs

ASJC Scopus subject areas

  • Anatomy
  • Instrumentation
  • Histology
  • Medical Laboratory Technology

Cite this

Two-In-one sample preparation for plan-VIew TEM. / Sáfrán, G.; Szász, Noémi; Sáfrán, Eszter.

In: Microscopy Research and Technique, Vol. 78, No. 7, 01.07.2015, p. 599-602.

Research output: Contribution to journalArticle

Sáfrán, G. ; Szász, Noémi ; Sáfrán, Eszter. / Two-In-one sample preparation for plan-VIew TEM. In: Microscopy Research and Technique. 2015 ; Vol. 78, No. 7. pp. 599-602.
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