Two-frequency heating technique at the 18 GHz electron cyclotron resonance ion source of the National Institute of Radiological Sciences

S. Biri, A. Kitagawa, M. Muramatsu, A. G. Drentje, R. Rácz, K. Yano, Y. Kato, N. Sasaki, W. Takasugi

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

The two-frequency heating technique was studied to increase the beam intensities of highly charged ions provided by the high-voltage extraction configuration (HEC) ion source at the National Institute of Radiological Sciences (NIRS). The observed dependences on microwave power and frequency suggested that this technique improved plasma stability but it required precise frequency tuning and more microwave power than was available before 2013. Recently, a new, high-power (1200 W) wide band-width (17.1-18.5 GHz) travelling-wave-tube amplifier (TWTA) was installed. After some single tests with klystron and TWT amplifiers the simultaneous injection of the two microwaves has been successfully realized. The dependence of highly charged ions (HCI) currents on the superposed microwave power was studied by changing only the output power of one of the two amplifiers, alternatively. While operating the klystron on its fixed 18.0 GHz, the frequency of the TWTA was swept within its full limits (17.1-18.5 GHz), and the effect of this frequency on the HCI-production rate was examined under several operation conditions. As an overall result, new beam records of highly charged argon, krypton, and xenon beams were obtained at the NIRS-HEC ion source by this high-power two-frequency operation mode.

Original languageEnglish
Article number02A931
JournalReview of Scientific Instruments
Volume85
Issue number2
DOIs
Publication statusPublished - Feb 1 2014

ASJC Scopus subject areas

  • Instrumentation

Fingerprint Dive into the research topics of 'Two-frequency heating technique at the 18 GHz electron cyclotron resonance ion source of the National Institute of Radiological Sciences'. Together they form a unique fingerprint.

  • Cite this