Twinning, dislocations and grain size in nanoSPD materials determined by X-ray diffraction

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

High resolution X-ray line profile analysis is sensitive to crystallite size, dislocation densities and character, and to planar defects, especially stacking faults or twinning. The different effects of microstructure features can be evaluated separately on the basis of the different corresponding profile functions and the different hkl dependences of line broadening. Profiles of faulted crystals consist of sub-profiles broadened and shifted according to different hkl conditions. The systematic analysis of the breadts and shifts of sub-profiles enables X-ray line profile analysis by using defect related profile functions corresponding to: (i) size, (ii) strain and (iii) planar faults, respectively. It is shown that twinning can either be enhanced or weakened by severe plastic deformation.

Original languageEnglish
Title of host publicationMaterials Science Forum
Pages571-578
Number of pages8
Volume584-586 PART 1
Publication statusPublished - 2008
Event4th International Conference on Nanomaterials by Severe Plastic Deformation - Goslar, Germany
Duration: Aug 18 2008Aug 22 2008

Publication series

NameMaterials Science Forum
Volume584-586 PART 1
ISSN (Print)02555476

Other

Other4th International Conference on Nanomaterials by Severe Plastic Deformation
CountryGermany
CityGoslar
Period8/18/088/22/08

Fingerprint

Twinning
twinning
Dislocations (crystals)
grain size
X ray diffraction
X rays
Defects
Stacking faults
Crystallite size
profiles
diffraction
Plastic deformation
x rays
Crystals
Microstructure
defects
crystal defects
plastic deformation
microstructure
shift

Keywords

  • Crystallite size
  • Dislocations
  • Nanomaterials
  • SPD
  • Stacking faults
  • Twinning
  • X-ray line profile analysis

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

Ungár, T., Balogh, L., & Ribárik, G. (2008). Twinning, dislocations and grain size in nanoSPD materials determined by X-ray diffraction. In Materials Science Forum (Vol. 584-586 PART 1, pp. 571-578). (Materials Science Forum; Vol. 584-586 PART 1).

Twinning, dislocations and grain size in nanoSPD materials determined by X-ray diffraction. / Ungár, T.; Balogh, L.; Ribárik, G.

Materials Science Forum. Vol. 584-586 PART 1 2008. p. 571-578 (Materials Science Forum; Vol. 584-586 PART 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ungár, T, Balogh, L & Ribárik, G 2008, Twinning, dislocations and grain size in nanoSPD materials determined by X-ray diffraction. in Materials Science Forum. vol. 584-586 PART 1, Materials Science Forum, vol. 584-586 PART 1, pp. 571-578, 4th International Conference on Nanomaterials by Severe Plastic Deformation, Goslar, Germany, 8/18/08.
Ungár T, Balogh L, Ribárik G. Twinning, dislocations and grain size in nanoSPD materials determined by X-ray diffraction. In Materials Science Forum. Vol. 584-586 PART 1. 2008. p. 571-578. (Materials Science Forum).
Ungár, T. ; Balogh, L. ; Ribárik, G. / Twinning, dislocations and grain size in nanoSPD materials determined by X-ray diffraction. Materials Science Forum. Vol. 584-586 PART 1 2008. pp. 571-578 (Materials Science Forum).
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