Trace element analysis by using the direct CPAA method

S. Takács, F. Ditrói, I. Mahunka

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Multielemental trace analysis was performed at Turku Cyclotron Laboratory on purified industrial aluminium samples and Ultra-High-Purity aluminium standards, produced by VAW (FRG), by using the direct CPAA (Charged Particle Activation Analysis) method. Both types of Al were expected to contain less than 10 ppm trace element contamination. 8 to 10 MeV proton beams were used for irradiation. The absolute trace quantities were determined for some ten elements by using the cross section curves and calculating the ranges of the bombarding particles in the samples, and measuring the absolute beam current and the intensities of the characteristic gamma-lines of the activated isotopes. The investigated elements are: Ca, Ti, V, Cr, Fe, Ni, Cu, Zn, Ga, Br and Zr. The obtained results were in good agreement with the guaranteed (VAW) data.

Original languageEnglish
Pages (from-to)1051-1053
Number of pages3
JournalNuclear Inst. and Methods in Physics Research, B
Issue numberPART 2
Publication statusPublished - May 15 1985


ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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