Topology analysis of scanning microscope images with structural entropy and discrete wavelet transform

Szilvia Nagy, András Fehér

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Topology free structure of scanning electron microscopy images of heat treated, metallized compound semiconductor surfaces are studied using structural entropy based analysis. The scale dependence and the possible superstructures are determined by wavelet transforming the images before the localization type detection. The studied images are taken in-situ during a thermalization experiment, using GaAs as a substrate and gold, zinc and SiO2 layers of 60 to 100 nm thickness.

Original languageEnglish
Title of host publication2011 18th International Conference on Systems, Signals and Image Processing, Proceedings IWSSIP 2011
Pages101-104
Number of pages4
Publication statusPublished - 2011
Event2011 18th International Conference on Systems, Signals and Image Processing, IWSSIP 2011 - Sarajevo, Bosnia and Herzegovina
Duration: Jun 16 2011Jun 18 2011

Other

Other2011 18th International Conference on Systems, Signals and Image Processing, IWSSIP 2011
CountryBosnia and Herzegovina
CitySarajevo
Period6/16/116/18/11

Fingerprint

Discrete wavelet transforms
Microscopes
Zinc
Entropy
Gold
Topology
Semiconductor materials
Scanning
Scanning electron microscopy
Substrates
Experiments
Hot Temperature

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Signal Processing
  • Software

Cite this

Nagy, S., & Fehér, A. (2011). Topology analysis of scanning microscope images with structural entropy and discrete wavelet transform. In 2011 18th International Conference on Systems, Signals and Image Processing, Proceedings IWSSIP 2011 (pp. 101-104). [5977396]

Topology analysis of scanning microscope images with structural entropy and discrete wavelet transform. / Nagy, Szilvia; Fehér, András.

2011 18th International Conference on Systems, Signals and Image Processing, Proceedings IWSSIP 2011. 2011. p. 101-104 5977396.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nagy, S & Fehér, A 2011, Topology analysis of scanning microscope images with structural entropy and discrete wavelet transform. in 2011 18th International Conference on Systems, Signals and Image Processing, Proceedings IWSSIP 2011., 5977396, pp. 101-104, 2011 18th International Conference on Systems, Signals and Image Processing, IWSSIP 2011, Sarajevo, Bosnia and Herzegovina, 6/16/11.
Nagy S, Fehér A. Topology analysis of scanning microscope images with structural entropy and discrete wavelet transform. In 2011 18th International Conference on Systems, Signals and Image Processing, Proceedings IWSSIP 2011. 2011. p. 101-104. 5977396
Nagy, Szilvia ; Fehér, András. / Topology analysis of scanning microscope images with structural entropy and discrete wavelet transform. 2011 18th International Conference on Systems, Signals and Image Processing, Proceedings IWSSIP 2011. 2011. pp. 101-104
@inproceedings{2516c59340494f5d8405213b9b6cf520,
title = "Topology analysis of scanning microscope images with structural entropy and discrete wavelet transform",
abstract = "Topology free structure of scanning electron microscopy images of heat treated, metallized compound semiconductor surfaces are studied using structural entropy based analysis. The scale dependence and the possible superstructures are determined by wavelet transforming the images before the localization type detection. The studied images are taken in-situ during a thermalization experiment, using GaAs as a substrate and gold, zinc and SiO2 layers of 60 to 100 nm thickness.",
author = "Szilvia Nagy and Andr{\'a}s Feh{\'e}r",
year = "2011",
language = "English",
isbn = "9789958996610",
pages = "101--104",
booktitle = "2011 18th International Conference on Systems, Signals and Image Processing, Proceedings IWSSIP 2011",

}

TY - GEN

T1 - Topology analysis of scanning microscope images with structural entropy and discrete wavelet transform

AU - Nagy, Szilvia

AU - Fehér, András

PY - 2011

Y1 - 2011

N2 - Topology free structure of scanning electron microscopy images of heat treated, metallized compound semiconductor surfaces are studied using structural entropy based analysis. The scale dependence and the possible superstructures are determined by wavelet transforming the images before the localization type detection. The studied images are taken in-situ during a thermalization experiment, using GaAs as a substrate and gold, zinc and SiO2 layers of 60 to 100 nm thickness.

AB - Topology free structure of scanning electron microscopy images of heat treated, metallized compound semiconductor surfaces are studied using structural entropy based analysis. The scale dependence and the possible superstructures are determined by wavelet transforming the images before the localization type detection. The studied images are taken in-situ during a thermalization experiment, using GaAs as a substrate and gold, zinc and SiO2 layers of 60 to 100 nm thickness.

UR - http://www.scopus.com/inward/record.url?scp=80055061053&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80055061053&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:80055061053

SN - 9789958996610

SP - 101

EP - 104

BT - 2011 18th International Conference on Systems, Signals and Image Processing, Proceedings IWSSIP 2011

ER -