Thin films of icosahedral AlMn phases; assessment of structural perfection

R. Manaila, R. Popescu, G. Korony, A. Jianu, A. Dévényi, P. Barna, Á Csanády, A. M. Dévényi

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The icosahedral metastable AlMn phase was obtained in thin films prepared by the high temperature sequential vapor deposition method. Analysis of X-ray diffraction line profiles allows an estimate of the random phason strain, revealing the presence of a highly disordered icosahedral fraction. Its concentration is correlated with the degree of crystallographic perfection of the Al substrate. Thereby, the crucial role of Al diffusion in the formation of the icosahedral phase is evidenced.

Original languageEnglish
Pages (from-to)14-18
Number of pages5
JournalThin Solid Films
Volume251
Issue number1
DOIs
Publication statusPublished - Oct 15 1994

Fingerprint

Vapor deposition
Metastable phases
vapor deposition
X ray diffraction
Thin films
Substrates
estimates
thin films
profiles
diffraction
x rays
Temperature

Keywords

  • Aluminium
  • Manganese
  • Structural properties

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Manaila, R., Popescu, R., Korony, G., Jianu, A., Dévényi, A., Barna, P., ... Dévényi, A. M. (1994). Thin films of icosahedral AlMn phases; assessment of structural perfection. Thin Solid Films, 251(1), 14-18. https://doi.org/10.1016/0040-6090(94)90833-8

Thin films of icosahedral AlMn phases; assessment of structural perfection. / Manaila, R.; Popescu, R.; Korony, G.; Jianu, A.; Dévényi, A.; Barna, P.; Csanády, Á; Dévényi, A. M.

In: Thin Solid Films, Vol. 251, No. 1, 15.10.1994, p. 14-18.

Research output: Contribution to journalArticle

Manaila, R, Popescu, R, Korony, G, Jianu, A, Dévényi, A, Barna, P, Csanády, Á & Dévényi, AM 1994, 'Thin films of icosahedral AlMn phases; assessment of structural perfection', Thin Solid Films, vol. 251, no. 1, pp. 14-18. https://doi.org/10.1016/0040-6090(94)90833-8
Manaila, R. ; Popescu, R. ; Korony, G. ; Jianu, A. ; Dévényi, A. ; Barna, P. ; Csanády, Á ; Dévényi, A. M. / Thin films of icosahedral AlMn phases; assessment of structural perfection. In: Thin Solid Films. 1994 ; Vol. 251, No. 1. pp. 14-18.
@article{1025f079cb594ca4b871aa2cd46b334e,
title = "Thin films of icosahedral AlMn phases; assessment of structural perfection",
abstract = "The icosahedral metastable AlMn phase was obtained in thin films prepared by the high temperature sequential vapor deposition method. Analysis of X-ray diffraction line profiles allows an estimate of the random phason strain, revealing the presence of a highly disordered icosahedral fraction. Its concentration is correlated with the degree of crystallographic perfection of the Al substrate. Thereby, the crucial role of Al diffusion in the formation of the icosahedral phase is evidenced.",
keywords = "Aluminium, Manganese, Structural properties",
author = "R. Manaila and R. Popescu and G. Korony and A. Jianu and A. D{\'e}v{\'e}nyi and P. Barna and {\'A} Csan{\'a}dy and D{\'e}v{\'e}nyi, {A. M.}",
year = "1994",
month = "10",
day = "15",
doi = "10.1016/0040-6090(94)90833-8",
language = "English",
volume = "251",
pages = "14--18",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier",
number = "1",

}

TY - JOUR

T1 - Thin films of icosahedral AlMn phases; assessment of structural perfection

AU - Manaila, R.

AU - Popescu, R.

AU - Korony, G.

AU - Jianu, A.

AU - Dévényi, A.

AU - Barna, P.

AU - Csanády, Á

AU - Dévényi, A. M.

PY - 1994/10/15

Y1 - 1994/10/15

N2 - The icosahedral metastable AlMn phase was obtained in thin films prepared by the high temperature sequential vapor deposition method. Analysis of X-ray diffraction line profiles allows an estimate of the random phason strain, revealing the presence of a highly disordered icosahedral fraction. Its concentration is correlated with the degree of crystallographic perfection of the Al substrate. Thereby, the crucial role of Al diffusion in the formation of the icosahedral phase is evidenced.

AB - The icosahedral metastable AlMn phase was obtained in thin films prepared by the high temperature sequential vapor deposition method. Analysis of X-ray diffraction line profiles allows an estimate of the random phason strain, revealing the presence of a highly disordered icosahedral fraction. Its concentration is correlated with the degree of crystallographic perfection of the Al substrate. Thereby, the crucial role of Al diffusion in the formation of the icosahedral phase is evidenced.

KW - Aluminium

KW - Manganese

KW - Structural properties

UR - http://www.scopus.com/inward/record.url?scp=0028517963&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028517963&partnerID=8YFLogxK

U2 - 10.1016/0040-6090(94)90833-8

DO - 10.1016/0040-6090(94)90833-8

M3 - Article

VL - 251

SP - 14

EP - 18

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - 1

ER -