Thickness-dependent conductivity of near-stoichiometric V2O5 films deposited from gels

T. Szörényi, K. Bali, I. Török, I. Hevesi

Research output: Contribution to journalArticle

7 Citations (Scopus)


The room temperature conductivity σ of initially nearly stoichiometric V2O5 films deposited from gels shows a marked thickness dependence. The analysis of conductivity data measured on films 50-3000 nm in thickness revealed that in air the films were spontaneously reduced from the air-film interface inwards forming layers of different chemical composition and conductivity. In the core layer, in which the initial composition presumably remains unchanged, σ ≈ 9 × 10-2 S m-1, while the conductivity of the reduced surface layer is considerably higher: σ ≈ 9 S m-1. In vacuum the conductivity of all the layers decreased by a factor of about 10 without much change in their relative order indicating that a varying water content uniformly affects the conductivities of all layers.

Original languageEnglish
Pages (from-to)29-34
Number of pages6
JournalThin Solid Films
Issue number1
Publication statusPublished - Nov 9 1984

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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