Thickness dependence of the quantum yield and attenuation length of photoelectrons in thin indium films

J. Peisner, P. Roboz, P. Barna

Research output: Contribution to journalArticle

17 Citations (Scopus)
Original languageEnglish
Pages (from-to)K187-K191
JournalPhysica Status Solidi (A) Applied Research
Volume4
Issue number3
DOIs
Publication statusPublished - 1971

Fingerprint

Indium
Quantum yield
Photoelectrons
indium
photoelectrons
attenuation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Thickness dependence of the quantum yield and attenuation length of photoelectrons in thin indium films. / Peisner, J.; Roboz, P.; Barna, P.

In: Physica Status Solidi (A) Applied Research, Vol. 4, No. 3, 1971, p. K187-K191.

Research output: Contribution to journalArticle

@article{ea2668f80d154afeaf68893b7c522ef2,
title = "Thickness dependence of the quantum yield and attenuation length of photoelectrons in thin indium films",
author = "J. Peisner and P. Roboz and P. Barna",
year = "1971",
doi = "10.1002/pssa.2210040335",
language = "English",
volume = "4",
pages = "K187--K191",
journal = "Physica Status Solidi (A) Applied Research",
issn = "0031-8965",
publisher = "Wiley-VCH Verlag",
number = "3",

}

TY - JOUR

T1 - Thickness dependence of the quantum yield and attenuation length of photoelectrons in thin indium films

AU - Peisner, J.

AU - Roboz, P.

AU - Barna, P.

PY - 1971

Y1 - 1971

UR - http://www.scopus.com/inward/record.url?scp=84983882722&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84983882722&partnerID=8YFLogxK

U2 - 10.1002/pssa.2210040335

DO - 10.1002/pssa.2210040335

M3 - Article

AN - SCOPUS:84983882722

VL - 4

SP - K187-K191

JO - Physica Status Solidi (A) Applied Research

JF - Physica Status Solidi (A) Applied Research

SN - 0031-8965

IS - 3

ER -